Atomic Force Microscope for Nanostructured Two-Dimensional Materials and Beyond

点击翻译按钮获取中文摘要

Atomic force microscopy (AFM) is a powerful tool for high-resolution imaging of nanostructured sample surfaces and for investigating materials' properties at the atomic level. It allows three-dimensional characterization of nanomaterials with sub-nanometer resolution. Various types of materials can be analyzed by AFM, from nanostructured to thin films and from two-dimensional (2D) materials to bulk materials. AFM plays a key role over electron microscopy, specifically to study how unique properties of low-dimensional materials under controlled environment correlate with their structural parameters. This application is a request for funds for purchasing a new AFM system for supporting research programs in materials science, nanotechnology, biophysics, and clean energy technologies at Brock University. Considering the research objectives of the applicants for studying different types of materials including nanostructured 2D materials, thin films, quantum materials, and biological membranes, it is urgently required to establish AFM facility at Brock. The principal applicant, J. Kaur's research program is in the emerging fields of nanostructured 2D materials and clean energy storage technologies which is funded through an NSERC Discovery grant. She will use the requested instrument to study the structures of surface-engineered 2D materials, electrolyte membranes and electrodes for solid-state energy devices. Co-applicant, M. Reedyk will use this instrument to characterize magnetic, optical, and multifunctional materials. Co-applicant, T. Harroun's biophysics research program would utilize the AFM to study structural properties of DNA and proteins. These research programs have supported numerous highly qualified personnel (HQP) in the last five years who have had the opportunity to publish results in high impact journals and conference publications. In addition, the AFM system will be accessible to all the members of the Faculty of Mathematics and Science at Brock University. We wish to purchase the MFP-3D Origin+ AFM system from Oxford Instruments Asylum Research because it offers high-resolution imaging with a full range of imaging modes and accessories at affordable price, as compared to Bruker. Its high performance and extensive capabilities allow a range of characterization modes (nanomechanical, magnetic and electrochemical) for a wide variety of samples, including soft biological materials and hard materials which makes it the most suitable choice. We intend to train 15-20 HQP each year on this equipment for pursuing their research goals. AFM is a foundational technique for materials characterization. It will be highly beneficial for HQP to get hands-on training on this instrument as it will not only advance their technical skills but also enhance their employability in industry and academia. The MFP-3D Origin+ AFM system from Oxford Instruments is essential for our collective research programs and for the timely completion of HQP training.