硅光电系统是下一代高带宽、低能耗的互联技术之一。然而作为系统的重要组成部分，非互易光学器件，一直未能实现硅上单片集成，严重影响了系统的发展。　本项目主要以硅上单片集成的多晶YIG（钇铁石榴石）薄膜为研究对象,拟开展薄膜集成工艺，缺陷掺杂，损耗机理和磁光性能的系统研究；并采用基于光波导和光谐振器的表征方法，精确测量薄膜损耗和法拉第旋光，澄清材料损耗机理，建立磁光性能与缺陷化学的物理联系，指导多晶YIG薄膜的集成工艺和掺杂改性，最终力争解决高优值磁光材料在硅上单片集成的难题。本项目的开展将阐明多晶钇铁石榴石薄膜光学损耗和磁光特性的物理根源，发展高优值的多晶磁光薄膜新材料，为硅上集成非互易光学器件奠定材料基础。

Silicon photonic system is a candidate for next generation high bandwidth, low power consumption interconnects. However, as an important component of optical systems, nonreciprocal photonic devices are still lacking in monolithically integrated devices on silicon, which severely undermined the whole system integration and development. This project mainly focuses on polycrystalline yttrium iron garnet thin films on silicon.We propose to systematically study the integration method, defect doping, loss mechanism and magneto-optical properties of polycrystalline YIG/doped YIG thin films. We also propose to construct new test structure based on optical waveguides and ring resonators, to accurately determine the material optical loss and Faraday constant; clarify the loss origin; establish the physical relation between magneto-optical properties and defect chemistry; create guidance to develop new integration methodology and defect doping strategy; and finally resolve the long-standing chanllege of integrating high figure of merit magneto-optical films on silicon. This project will clarify the physical origin of optical loss and magneto-optical effects in polycrystalline magnetic garnet thin films, develop new materials with high magneto-optical figure of merit, and prepare polycrystalline magneto-optical thin films for on-chip integration of nonreciprocal photonic devices.