随着卫星向小型化、轻量化和低功耗方向发展，频率综合器的功耗和可靠性成为星载射频通信系统的发展瓶颈。在恶劣的空间环境中，总剂量辐射效应是影响频率综合器性能退化、甚至功能失效的主要损伤来源。本项目拟以低功耗频率综合器为研究对象，通过辐射试验与仿真建模相结合的方法，从器件、电路和系统三个层面对其总剂量辐射效应开展深入的研究。首先，考虑温度变化的影响，建立基于反型系数的器件总剂量辐射效应模型；然后，进行电路模块的低功耗和抗总剂量效应设计，探索相应模块的多参数非线性总剂量响应特性；最后，结合电路模块的电学参数退化情况，构建频率综合器的总剂量辐射损伤传输模型。本项目的实施将解决由于频率综合器结构复杂所导致的内部模块无法测试分析的问题，揭示电离辐射损伤从晶体管、到电路模块、到闭环系统的传递规律，丰富低功耗和高可靠电路的优化设计理论，为面向空间应用的低功耗频率综合器的设计和评估提供支持。

With the development of satellite towards miniaturization, lightweight and low power consumption, the power consumption and reliability of frequency synthesizers become bottlenecks of satellite radio communication systems. In the extreme space environment, total-ionizing dose (TID) effect is a major damage source which leads to performance degradation and even functional failure of frequency synthesizers. Therefore, in this project, the TID effects on low-power frequency synthesizers are comprehensively studied, by means of radiation experiments and simulations, from the aspects of devices, circuits, and systems. Firstly, with consideration of the impact of temperature variations, a TID model is established based on the inversion coefficient. Then, low-power and TID-hardened circuit modules are designed, and their corresponding multi-parameter and nonlinear radiation response characteristics are investigated. Finally, the damage transfer model of the frequency synthesizer is developed based on the electrical parameter degradation of the circuit modules. The implementation of this project will solve the test and analysis problems of internal modules resulted from the complex structure of frequency synthesizer and reveals the rules of damage transfer from transistors, circuit modules, to the closed-loop system. Besides, it will enrich the optimization design theory of low-power and high-reliability circuits, and provides support for the design and evaluation of low-power frequency synthesizers in space applications.