探索一种针对高温超导薄膜表面电阻分布的准确且高效测试手段，无论对高温超导薄膜的研究、制备还是应用都具有重要的意义。在超导理论研究过程中，需要依靠实验方法对超导材料微波电阻随频率、温度等物理量的变化关系等理论结果进行验证；在薄膜的制作过程中，其微波表面电阻分布的检测有利于制作工艺的调整；在设计微波无源器件时，薄膜微波表面电阻分布的准确提取可保证高性能超导微波器件的设计效率。目前，传统的介质谐振器测试方法电磁场分布较为松散，并不适合应用于薄膜表面电阻分布这种小尺寸下的测试；而工作频率通常在3mm波段的准光腔测试手段，对测试系统的要求颇高。因此，本研究旨在建立一种通用且具有高分辨率的超导薄膜微波表面电阻分布测试手段。研究拟基于镜像介质谐振器法，在较低工作频率实现电磁场能量的汇聚，解决传统介质谐振器测试理论模型中高测试准确度和高分辨率难以兼顾的局限性。

To establish an accurate and effective method for measuring the microwave surface resistance (Rs) distribution of high temperature superconducting thin film (HTSTF) is significant for the research, fabrication and application of HTSTF. In the mechanism research of superconductor, the relationships between Rs and other physical quantities such as frequency and temperature deduced by theory model require verification by experiment. Proper adjustment could be made according to the testing results of the Rs distribution during the manufacturing process of HTSTF. In the aspect of device design, the design efficiency of high performance superconductor microwave passive device can be guaranteed by measuring the Rs distribution of HTSTF accurately. At present, the distribution of electromagnetic field of traditional dielectric resonator method is too loose to measure the Rs distribution of HTSTF with high resolution, while the frequency of quasi optical resonator method is too high to construct a universal measurement system. Therefore, a novel theory model which can applied conveniently for the Rs distribution measurement with high resolution is need. Based on the image dielectric resonator method, this research attempts to focus electromagnetic energy on HTSTF at relatively low frequency and to solve the limitations of traditional dielectric resonator in achieving both high accuracy and resolution.