An Efficient and Accurate Method for HTS Surface Resistance Measurement

An Efficient and Accurate Method for HTS Surface Resistance Measurement
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一种高效、准确的高温超导表面电阻测量方法

DOI:
10.1007/s10948-015-3199-y
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发表时间:
2015-08
影响因子:
1.8
通讯作者:
Liu Chen
Liu Chen
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
Cheng Zeng;Liu Chen

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本文提出了一种基于改进的图像介电方法设计谐振器的新方法,用于有效测量低不确定度的高温超导体(HTS)薄膜的表面电阻(RS)。给出了简单的公式来评估蓝宝石棒tanδ变化引起的测量误差。根据公式,可以通过选择合适尺寸的蓝宝石棒来减小该误差。基于这种新方法,设计了三种采用改进镜像介电法的谐振器。进行实验室间循环测试的目的是调查测量不确定度。循环测试表明,相对不确定度不大于12.6%,小于高温超导薄膜RS测量国际标准规定的相对不确定度值的20%。据作者所知,这些是测量 HTS 薄膜 RS 的最有效设备,并且具有相同的不确定性。
A new way to design resonator for efficiently measuring surface resistance (RS) of high-temperature superconductor (HTS) thin films with low uncertainty based on improved image dielectric method is developed in this paper. Simple formula is given to evaluate measurement error caused by the variation of tanδof sapphire rod. According to the formula, this error could be decreased by choosing appropriate size of sapphire rod. Three resonators using improved image dielectric method were designed based on this new way. Interlaboratory round robin test was performed with the aim of investigating the measurement uncertainty. The round robin test shows that the relative uncertainties are no more than 12.6 % which is less than 20 % the relative uncertainty value specified in international standard on HTS thin filmRSmeasurement. As far as the authors know, these are the most efficient devices to measure theRSof HTS thin film with equal uncertainty.
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