An Efficient and Accurate Method for HTS Surface Resistance Measurement
An Efficient and Accurate Method for HTS Surface Resistance Measurement
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一种高效、准确的高温超导表面电阻测量方法
DOI:
10.1007/s10948-015-3199-y
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发表时间:
2015-08
影响因子:
1.8
通讯作者:
Liu Chen
中科院分区:
文献类型:
--
作者:
Cheng Zeng;Liu Chen
A new way to design resonator for efficiently measuring surface resistance (RS) of high-temperature superconductor (HTS) thin films with low uncertainty based on improved image dielectric method is developed in this paper. Simple formula is given to evaluate measurement error caused by the variation of tanδof sapphire rod. According to the formula, this error could be decreased by choosing appropriate size of sapphire rod. Three resonators using improved image dielectric method were designed based on this new way. Interlaboratory round robin test was performed with the aim of investigating the measurement uncertainty. The round robin test shows that the relative uncertainties are no more than 12.6 % which is less than 20 % the relative uncertainty value specified in international standard on HTS thin filmRSmeasurement. As far as the authors know, these are the most efficient devices to measure theRSof HTS thin film with equal uncertainty.
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影响因子:
1.8
作者:
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DOI:
10.1109/iccs.1994.474261
发表时间:
1994-11
期刊:
Proceedings of ICCS '94
影响因子:
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DOI:
10.1016/s0921-4534(02)02065-8
发表时间:
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影响因子:
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作者:
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