Surface and Thin Film Investigations with Low Energy Positrons

利用单能、低能正电子束研究多层异质结构的结构和电子性质的实验计划。再发射正电子能谱、正电子生成分数和湮没辐射的多普勒展宽技术将被用来研究(1)正电子输运，特别是正电子输运。金属-硅和硅-硅化物界面的影响，(2)正电子隧道显微镜，和(3)热正电子在金属薄膜中的热化和基态形成。

Experimental program employing monoenergetic, low-energy beams of positrons to investigate the structural and electronic properties of multilayer heterostructures. The techniques of reemitted positron spectroscopy, positronium formation fraction, and Doppler broadening of annihilation radiation will be used in a depth profiling mode to study (1) positron transport, esp. effects at metal-Si and Si-silicide interfaces, (2) positron tunneling microscopy, and (3) thermalization of hot positrons and ground state formation in thin metal films.