Computer-aided Instruction of Surface Analysis Techniques

材料科学中最重要的四种表面分析技术是：(1)俄歇电子能谱、(2)X射线光电子能谱、(3)二次离子质谱仪和(4)卢瑟福背散射光谱。虽然被广泛使用，但教育机构并没有相应地增加对它们的重视。本项目的研究工作是创建一个用于表面分析教学的计算机辅助教学(CAI)实验室资源。课程将介绍这些技术的仪器、实验和理论方面的考虑，以及设计和进行假设性实验的能力。

Four of the most important surface analytical techniques for materials science are: (1) Auger Electron Spectrometry, (2) X- ray Photo-electron Spectrometry, (3) Secondary Ion Mass Spectrometry, and (4) Rutherford Backscattering Spectrometry. While of widespread use, there has not been a concomitant increase in their emphasis at educational institutions. The research effort in this project is the creation of a Computer- Aided Instruction (CAI) laboratory resource for surface analysis education. Instrumental, experimental, and theoretical considerations for the techniques will be presented along with the ability to design and conduct hypothetical experiments.