Experimental Study of Dynamic Scaling in Epitaxial Growth

我们计划使用一种强大的组合技术-高分辨率LEED，扫描隧道显微镜(STM)和漫反射光散射(DLS)来研究从原子到亚微米尺度的界面过程的动力学。包括金属上金属膜和半导体上金属膜从亚单层到多层膜的生长、形貌和动力学粗化转变。其目的是在原子水平上更好地理解和控制界面过程。

We plan to use a powerful combination of technique - High- Resolution LEED, scanning tunneling microscope (STM) and diffuse light scattering (DLS) to study the kinetics of interfacial processes from the atomic to the sub-micron scale. Included will be the growth, morphology and kinetic roughening transition of metal films on metals and of metal films on semiconductors from sub-monolayer to many layers thick. The goal is to better understand and to control the interfacial processes at the atomic level.