In Situ Quantitative Measurement of Structural and Magnetic Properties of Nano-Structured Cobalt Films and Wires

纳米结构钴膜和线的结构和磁性的原位定量测量

• 批准号: 9701488
• 负责人: Gwo-Ching Wang
• 金额: $ 12.6万
• 依托单位: Rensselaer Polytechnic Institute
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1997
• 资助国家: 美国
• 起止时间: 1997-08-15 至 2001-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9701488&HistoricalAwards=false
• 关键词: Situ; Quantitative; Measurement; Structural; Magnetic

9701488 Wang This project examines the structure and magnetic properties of epitaxial Co/Cu/Co trilayers and Co OwiresO prepared by molecular beam epitaxy (MBE). The Co and trilayer films are grown on flat and vicinal (step bunched) silicon (111) surfaces, respectively. The parameters describing the interface roughness and mixing of these Co nanostructures are determined quantitatively in situ from the angular profile measurement of diffraction beams using high resolution, low energy electron diffraction complemented with scanning electron microscopy. The coercivity, magnetic anistropy, exchange coupling, magneto resistance, and magnetic inhomogeneity are obtained in situ from the surface magneto-optic Kerr effect (SMOKE), ferromagnetic resonance, and the Van der Pauw method. Atomic force microscopy and magnetic force microscopy provide important information on morphology and magnetic domain wall structures. In addition the temperature dependence and magnetic stability of these nanostructures are studied. %%% The quantitative relationship between interface roughness and magneto resistance and magnetic exchange coupling and their temperature dependence will permit an optimization of the trilayer that has the largest and thermally stable magneto resistance at very low magnetic fields. Such materials have applications in magnetic read heads for ultrahigh density hard disk drives. ***

9701488 Wang 该项目研究了通过分子束外延（MBE）制备的外延Co/Cu/Co三层和Co OwiresO的结构和磁性能。 Co 和三层膜分别生长在平坦和邻接（阶梯簇状）硅（111）表面上。 描述这些 Co 纳米结构的界面粗糙度和混合的参数是通过使用高分辨率、低能电子衍射并辅以扫描电子显微镜对衍射束的角度轮廓测量进行原位定量确定的。 矫顽力、磁各向异性、交换耦合、磁阻和磁不均匀性是通过表面磁光克尔效应 (SMOKE)、铁磁共振和范德堡方法原位获得的。 原子力显微镜和磁力显微镜提供有关形态和磁畴壁结构的重要信息。 此外，还研究了这些纳米结构的温度依赖性和磁稳定性。 %%% 界面粗糙度和磁阻以及磁交换耦合之间的定量关系及其温度依赖性将允许对在非常低的磁场下具有最大且热稳定的磁阻的三层进行优化。 此类材料可应用于超高密度硬盘驱动器的磁读取头。 ***