Fault Modeling and Test Generation for Mixed-Signal Integrated Circuits

本文的研究方向是混合信号集成电路的故障建模和测试生成。在故障模型方面，利用缺陷统计和良率统计来推导模拟电路的综合故障模型。其中包括可用于测试设计和测试生成的功能故障模型。目前正在为模拟电路推导新的测试生成算法，并且正在开发将模拟测试与混合信号电路中的数字电路相连接的技术。这些基本理论正在用设计和工业数据进行实验验证。

Abraham This research is on fault modeling and test generation for mixed signal integrated circuits. In the area of fault models, defect and yield statistics are being used to derive comprehensive fault models for analog circuits. These include functional fault models useable in design for test and test generation. New test generation algorithms are being derived for analog circuits, and techniques are being developed to interface the analog tests with the digital circuitry in a mixed signal circuit. The fundamental theories are being validated experimentally with designs and data from industry.