Acquisition of a Field-Emission Scanning Electron Microscope

小行星9311302 这种场发射扫描电子显微镜（FE-SEM）将用于表征纳米范围内材料的微观结构。 首先将仪器应用于先进的陶瓷研究，我们将监测加热和冷却过程中添加剂的分布，从而确定最终产品的性能。 为了开发合适的模型，在烧结的早期阶段对纳米尺寸的添加剂颗粒及其在陶瓷粉末表面上的分布进行成像是必要的。 其次，在我们的碳纳米管的形态和产量的研究中，它是必不可少的，以检查电弧放电的阴极上的碳沉积物的目的，优化的加工条件，用于生产所需的形状和尺寸的碳簇。 第三个项目研究具有与骨骼和牙齿等天然材料相同结构的仿生复合材料。 该研究旨在开发将各种矿物质生长成聚合物基质的方法，该聚合物基质具有类似于纳米范围内的天然材料的粒度，形状和方向的尺寸特征。 第四个项目研究了在光学数据存储设备中使用的平面波导中的散射损耗，通过在表面使用受控的晶体成核，检测和识别这些材料内部的散射中心。 硅晶片上的铜污染将作为第五个项目领域进行研究。 在各种加工条件下，将直接观察和识别纳米范围内的沉积物。 检查铜晶体及其相关的衬底腐蚀和溶解模式将有助于在半导体器件的化学处理期间消除金属污染的策略。 这五个项目将作为广泛的基本问题的例子，其中FE-SEM的可用性将推动相关材料的研究。 其他项目将迅速加入这五个，从医学研究，生物化学，生物技术，地球科学，光学数量级比以前小，是至关重要的问题，特别是在相关的基本过程的早期阶段。 通过相关的研究，技术领域将取得进展，从工业进步的角度为获得这一强大的仪器提供适当的理由。 ***

9311302 Seraphin This field-emission scanning electron microscope (FE-SEM) will be for the characterization of the microstructure of materials in the nanometer range. Applying first the instrument to advanced ceramic studies, we will monitor the distribution of additives during heating and cooling that determines the properties of the final product. In order to develop appropriate models, it is essential to image during the early phase of sintering the additive particles of nanometer size, and their distribution on the surface of the ceramic powder. Secondly, in our studies of the morphology and yield of carbon nanotubes, it is essential to examine the carbonaceous deposits on the cathode of the arcdischarge with the purpose of optimizing the processing conditions for the production of a desired shape and size of the carbon clusters. A third project examines biomimetic composites with the same architecture as natural materials such as bones and teeth. The study aims at the development of methods to grow various minerals into a polymer matrix of the dimensional characteristics of particle sizes, shapes and orientation that resembles the natural material in the nanometer range. A fourth project investigates the scattering losses in planar waveguides used in optical data storage devices through the use of controlled crystal nucleation at the surfaces, detecting and identifying thus scattering centers in the interior of these materials. Copper contamination on silicon wafers will be studied as the fifth project area. The deposits, once again in the nanometer range, will be directly observed and identified under various processing conditions. Examining the copper crystals and their associated substrate corrosion and dissolution patterns will facilitate strategies that eliminate metal contamination during chemical processing of semiconductor devices. The five projects will serve as examples for the wide range of fundamental issues in which the availabi lity of the FE-SEM will advance related materials research. Additional projects will rapidly join these five, taken from medical research, biochemistry, biotechnology, geoscience, optical orders of magnitudes smaller than before, is of vital issue, especially in the early phases of related fundamental processes. Areas of technological interest will advance through the related research, giving the acquisition of this powerful instrument a proper justification in terms of industrial advances. ***