GOALI: Atomic Correlations in Disordered Materials Observed using Variable Coherence Transmission Electron Microscopy

吉布森 该GOALI研究项目得到了办事处的部分支持， 多学科活动（OMA） 的 MPS董事会，打算开发一种定量技术，使用TEM来表征无定形和无序材料中的网络结构。尽管TEM在研究晶体材料中的缺陷方面非常成功，但迄今为止，它在表征非晶材料方面的用处不大。 本项目的前提是，高分辨率TEM图像，尽管如此，包含了大量的信息，在无序材料的微观结构。的一个重要方面 的 提出 新技术，将 被 在实验和理论上的追求，是使用三体相关函数给新的洞察中程秩序。 理论 将探索直接从实验中提取高阶相关函数的方法。待研究的材料包括非晶半导体、闸极晶体管和铁电体。这项工作将由两个PI合作进行，一个来自大学，一个来自工业实验室，以及一个联合监督的研究生，他们将从工业研究中受益。 % GOALI研究项目得到了办公室的部分支持 多学科活动（OMA） 的 MPS董事会，将由一个团队进行， 材料科学家，都是透射电子显微镜（TEM）的使用专家，一个在研究型大学，另一个在领先的工业研究实验室。一个优秀的研究生将受益于两个PI的联合监督，并在做他/她的论文研究的重要部分的过程中 在工业实验室，将获得宝贵的经验， 和工业界的联系。该项目旨在扩大TEM在评估真实的材料中存在的无序程度方面的实用性，包括半导体晶体管器件中的核心栅极氧化物。给定材料中的无序程度的知识可用于预测其在给定应用中的性能。该项目的成果预计将包括有关TEM使用的新知识，并与显着的工业接触的优秀培训经验，为研究生。 ***

w:\awards\awards96\num.doc 9703906 Gibson This GOALI research project, which is supported in part by the Office of Multidisciplinary Activities (OMA) of the MPS Directorate, intends to develop a quantitative technique using the TEM to characterize network structure in amorphous and disordered materials. Although TEM has been highly successful in the study of defects in crystalline materials, it has been less useful thus far in characterizing amorphous materials. The present project is based on the premise that the high resolution TEM image, nonetheless, contains a wealth of information about the microstructure in disordered materials. An important aspect of the proposed new technique, which will be pursued experimentally and theoretically, is the use of the three-body correlation function to give new insight into medium range order. Theoretical methods for extracting higher-order correlation functions directly from experiment will be explored. Materials to be studied include amorphous semiconductors, gate dielectrics, and ferroelectrics. This work will be carried out collaboratively by two PI's , one from a university, one from an industrial lab, and by a jointly supervised graduate student who will benefit from a significant exposure to industrial research. %%% This GOALI research project, which is supported in part by the Office of Multidisciplinary Activities (OMA) of the MPS Directorate, will be carried out by a team of materials scientists, both experts in use of the Transmission Electron Microscope (TEM), one at a research university, and the other at a leading industrial research laboratory. An excellent graduate student will benefit from joint supervision by the two PI's, and in the process of doing a significant portion of his/her thesis research at the industrial laboratory, will gain valuable experience and contacts in industry. The project is designed to extend the usefulness of the TEM in assessing the degree of disorder present in real materials, including gate oxides which are central in semiconductor transistor devices. Knowledge of the degree of disorder in a given material can be useful in predicting its performance in a given application. The outcomes of the project are expected to include new knowledge concerning the use of the TEM, and an excellent training experience with significant industrial exposure, for a graduate student. ***