Soft X-Ray Spectroscopy Using Synchrotron Radiation

9801804 Callcott该项目由一个重点研究小组进行，来自田纳西州T.A. Calcott的三所大学的六名科学家；d·l·埃德勒，杜兰；A. Moewes，路易斯安那州和三个国家实验室，E.L. Shirley，国家标准与技术研究所；R.C. Perera，劳伦斯伯克利实验室；剩下Terminello。劳伦斯利弗莫尔国家实验室将继续他们在软x射线光谱学方面的长期合作研究，通过使用软x射线荧光（SXF）光谱学、软x射线吸收（SXA）光谱学和软x射线光电发射（SXPS）光谱学技术的同步加速器源。主要研究三个领域：1)SXF和SXA将用于研究含有4d、5d和4f元素的化合物；2)新的实验将以理论为重点，对阈值附近激发的SXF光谱进行研究，这必须描述为一个共振的非弹性x射线散射过程；3) SX光谱将作为深层探针，用于研究体性质、埋藏结构和界面，并探索驻波模式在x射线反射多层材料中的应用。通过这些研究获得的认识涉及到高温超导性、巨磁电阻、压电、电致伸缩和磁致伸缩效应等问题，以及多层体系中基体隔离纳米粒子的电子性质、界面性质和界面隔离杂质的性质。这项研究将使用劳伦斯伯克利国家实验室的先进光源设备和路易斯安那州立大学的CAMD光源。重点研究小组由来自田纳西州T.A.卡尔科特三所大学的六名科学家组成；d.l.e derer，杜兰；A. Moewes，路易斯安那州和三个国家实验室，E.L. Shirley，国家标准与技术研究所；R.C. Perera，劳伦斯伯克利实验室；剩下Terminello。劳伦斯利弗莫尔国家实验室将继续他们在软x射线光谱学方面的长期合作研究，利用同步加速器光源，使用软x射线荧光光谱学、软x射线吸收光谱学和软x射线光谱学技术。研究的目标领域包括研究含有元素的化合物，这些元素是目前处于研究前沿的材料的特征成分，以确定它们在先进技术设备中的适用性，研究体积性质，埋藏结构和界面，以及探索在x射线反射多层材料中使用驻波模式。通过这些研究获得的认识涉及到高温超导性、巨磁电阻、压电、电致伸缩和磁致伸缩效应等问题，以及多层体系中基体隔离纳米粒子的电子性质、界面和界面隔离杂质的性质。这项研究将使用劳伦斯伯克利国家实验室的先进光源设备和路易斯安那州立大学的CAMD光源。除了指定的主要研究人员外，还有大量来自其他大学和研究机构的合作者，包括本科生和研究生以及博士后研究助理。这些合作确保了研究成果广泛传播到工业界、学术界和国家实验室的其他研究小组，并有助于培养下一代研究科学家。＊＊＊

9801804 Callcott This project pursued by a Focused Research Group, six scientists from three universities T.A. Calcott, Tennessee; D.L. Ederer, Tulane; A. Moewes, Louisiana State and three national laboratories E.L. Shirley, National Institute of Standards and Technology; R.C. Perera, Lawrence Berkeley Laboratory; L.J. Terminello. Lawrence Livermore National Laboratory , will continue their long standing collaborative research in soft x-ray spectroscopy by means of synchrotron sources using the techniques of soft x-ray fluorescence (SXF) spectroscopy, soft x-ray absorption (SXA) spectroscopy, and soft x-ray photoemission (SXPS) spectroscopy. Three areas are targeted for investigation: 1) SXF and SXA will be used to study compounds containing 4d, 5d, and 4f elements; 2) New experiments combined with a major emphasis on theory will be directed to the study of SXF spectra excited near threshold which must be described as a resonant inelastic x-ray scattering process; and 3) SX spectroscopies will be used as deep probes for the study of bulk properties, and buried structures and interfaces, and to explore the use of standing wave patterns in x-ray reflecting multilayers. The understandings obtained through these studies have bearing on the problems of high temperature superconductivity, giant magnetoresistance, and piezoelectric, electrostrictive and magnetostrictive effects, as well on the electronic properties of matrix isolated nano-particles, the properties of interfaces and impurities isolated at interfaces in multilayer systems. The facilities of the Advanced Light Source at the Lawrence Berkeley National Laboratory and the CAMD light source at Louisiana State University will be used in this research. %%% The Focused Research Group composed of six scientists from three universities T.A. Calcott, Tennessee; D.L. E derer, Tulane; A. Moewes, Louisiana State and three national laboratories E.L. Shirley, National Institute of Standards and Technology; R.C. Perera, Lawrence Berkeley Laboratory; L.J. Terminello. Lawrence Livermore National Laboratory will continue their long standing collaborative research in soft x-ray spectroscopy by means of synchrotron light sources using the techniques of soft x-ray fluorescence spectroscopy, soft x-ray absorption spectroscopy, and soft x-ray photoemission spectroscopy. Among the areas targeted for investigation are the study of compounds containing elements which are characteristic components of those materials that are currently at the forefront of investigations to ascertain their suitability in advanced technological devices, the study of bulk properties, buried structures and interfaces, and the exploration of the use of standing wave patterns in x- ray reflecting multilayers. The understandings obtained through these studies have bearing on the problems of high temperature superconductivity, giant magnetoresistance, and piezoelectric, electrostrictive and magnetostrictive effects, as well as on the electronic properties of matrix isolated nano-particles, and the properties of interfaces and impurities isolated at interfaces in multilayer systems. The facilities of the Advanced Light Source at the Lawrence Berkeley National Laboratory and the CAMD light source at Louisiana State University will be used in this research. In addition to the named principal investigators there is a large number of collaborators from other universities and research institutions, including undergraduate and graduate students and post doctoral research associates. These collaborations insure the wide dispersal of the results of the research to other research groups in industry, academe, and national laboratories, and serve to train the next generation of research scientists. ***