Workshop on Future Research Directions in Testing of Electronic Circuits and Systems, Santa Barbara, CA

这次研讨会是关于评估超大规模集成电路测试领域内研究的优先事项，目的是帮助该领域重新将重点放在测试深亚微米VLSI芯片的算法、技术和方法所必需的研究上。考虑了未来研究和教育的优先事项。已经得到学术界和工业界测试界很好服务的研究领域，不太可能需要重大的新方法或技术突破，正在进行审查。研讨会报告包括：(1)陈述未来十年内最迫切需要解决的问题；(2)就研究的风格和种类提出建议，以及就如何实施这些建议向社会提出建议；以及(3)关于增加VLSI测试领域对电子和计算机工程教育的影响的观点。

This workshop is on evaluating priorities for research within the VLSI testing field, with the intention that the results of the meeting aid in refocusing the field on research necessary to algorithms, techniques and methodologies for testing deep submicron VLSI chips. Future priorities for research and education are considered. Research areas that are already well-served by the test communities in academia and industry and are unlikely to require major new methods or technological breakthroughs are being examined. The workshop report includes: (1) a statement of the most pressing problems to solve within the next decade, (2) recommendations regarding the style and kind of research to be conducted and suggestions to the community as to how to implement these suggestions, and (3) viewpoints on increasing the impact of the VLSI test field on education in electrical and computer engineering.