1998 Gordon Research Conference on Point Line Defects in Semiconductors, Colby-Sawyer College, New London, NH, July 12-17, 1998

9810094 Storm A Gordon研究会议将于1998年7月12日至17日举行，主题是与电子材料的生长和加工有关的同质和结构半导体中的缺陷和缺陷相关现象的理论和实验方面的问题。将强调具有争议性和/或前瞻性的主题。该计划由20名受邀演讲者、11名讨论负责人、1名主席、副主席和计划委员会组成；双方都安排了投稿论文和海报。目标是促进广大研究人员之间的交流，他们解决各种学科背景--化学、物理、工程学和材料科学--的缺陷，并制定和描述必要的关键研究，以加深基本理解并使概念更接近技术成功。预计这次会议将为讨论半导体缺陷领域的关键科学问题提供一个有效的论坛。随着评估该领域和未来方向的机会，预计大学、研究机构和行业之间将建立新的联系。评估半导体中与电子材料和器件相关结构的生长和加工有关的缺陷和缺陷相关现象的进展和现状，以及对该领域最重要的发展的当前评估，将对理解和加强材料在计算、数据处理和通信中的利用具有重要价值。***

9810094 Storm A Gordon Research Conference will be held July 12-17, 1998 on theoretical and experimental aspects of defects and defect- related phenomena in homogeneous and structured semiconductors, associated with growth and processing of electronic materials. Topics which are controversial and/or forward-looking will be emphasized. The program is organized around 20 invited speakers, 11 discussion leaders, a chair, vice-chair, and program committee; both contributed papers and posters are scheduled. Objectives are to stimulate communications among the broad community of researchers who address defects from a variety of disciplinary backgrounds--chemistry, physics, engineering and materials science, and to formulate and delineate critical research necessary to further basic understanding and move concepts closer to technological success. The conference is expected to provide an effective forum for discussion of critical scientific issues in the area of defects in semiconductors. Along with the opportunity to assess the field and future directions, it is expected that new ties will be established between universities, research institutions, and industry. %%% An evaluation of the progress and status of defects and defect- related phenomena in semiconductors associated with growth and processing of electronic materials and device related structures along with current assessments of the most important developments in this field will be of great value to the understanding and enhanced utilization of materials in computing, data processing, and communications. ***