MRI: Acquisition of a FEG Transmission Electron Microscope for Nanostructured Materials and Earth Sciences Research

摘要- CTS-9871292 - Datye - Papiki - Xu教授Abhaya K.美国的Datye和James J. Papiki以及Huifang Xu博士。新墨西哥州的JEOL公司将购买一台JEOL Model 2010 200 keV场发射电子枪，该电子枪结合了透射电子显微镜和扫描透射电子显微镜（FEG-TEM-STEM），用于纳米结构材料和地球科学研究。新的FEG-TEM-STEM将产生元素分析（通过能量色散和电子能量损失光谱）和亚纳米级材料的新型成像（通过Z对比度和电子全息术）。这种分辨率对于推进纳米结构材料、其化学和物理学及其在地球科学和多种现代技术中的作用的知识至关重要。FEG-TEM-STEM将是现有显微镜实验室中的顶级仪器，包括电子探针，扫描电子显微镜，X射线衍射仪和一套样品制备设备。该实验室将为美国大学的多名研究人员提供研究机会。N. M.，以及N. M.高地大学和N. M.采矿与技术学院，包括化学与核工程、电气与计算机工程、地球与行星科学以及生物学等系。它还将为学生提供动手显微镜教学。

Abstract - CTS-9871292 - Datye - Papiki - Xu Professors Abhaya K. Datye and James J. Papiki, and Dr. Huifang Xu, of the U. of New Mexico, will acquire a JEOL Model 2010 200 keV field emission gun combination transmission electron microscope and scanning transmission electron microscope (FEG-TEM-STEM) for nanostructured materials and earth sciences research. The new FEG-TEM-STEM will yield elemental analysis (by energy-dispersion and electron-energy loss spectroscopies) and novel imaging (by Z-contrast and electron holography) of materials at the sub-nanometer scale. Such resolution is essential for advancing the knowledge of nanostructured materials, their chemistry and physics, and their role in earth sciences and a multiplicity of modern technologies. The FEG-TEM-STEM will be the top-of-the-line instrument in an existing microscopy laboratory which includes an electron microprobe, a scanning electron microscope, an X-ray diffractometer, and a suite of sample preparation equipment. The laboratory will provide research access to multiple investigators at U. N. M., and to faculty of N. M. Highlands U. and N. M. Inst. Mining and Technology, involving the departments of Chemical and Nuclear Engineering, Electrical and Computer Engineering, Earth and Planetary Sciences, and Biology. It will also provide hands-on microscopy instruction to students.