U.S.-Japan Joint Seminar: Contribution of In Situ Electron Microscopy to Understanding and Creation of Advanced Materials

9981689 Sinclair该奖项支持美国科学家参与美国- 2000年11月7日至10日在日本京都举行的关于原位电子显微术对了解和创造先进材料的贡献的日本讨论会。 共同组织者是斯坦福大学教授罗伯特·辛克莱（Robert Sinclair）和日本名古屋大学教授坂博康（Hiroyasu Saka）。 大多数原位TEM（透射电子显微镜）在美国和日本进行。 前者在材料科学应用（例如薄膜沉积、半导体缺陷行为和催化）方面具有优势，而后者具有更广泛的硬件（例如更高电压的显微镜、更高温度的试样保持器和压电器件）。 目前，交流思想、实验或人员的基础很少。这次研讨会将包括介绍该领域的最新发展。 此外，还将强调两国方法的优势。 未来将有相当一部分时间用于开发该领域，并假设最终的合作。如今，许多高科技材料都是从原子水平开始制造的（例如微电子，计算机硬盘，纳米材料）。 了解和提高其性能需要在极高的放大倍率和分辨率水平下进行检查，这是由透射电子显微镜提供的。 这一方法正在以越来越多的方式和更创新的方式得到应用。 研讨会的组织者作出了特别努力，让年轻的研究人员既参加研讨会，又作为观察员参加。 与日本专家在这一领域的想法和数据交流将使美国参与者能够推进自己的工作，并为未来的合作项目奠定基础。 研讨会论文集的传播计划包括在“电子显微镜杂志”上发表。研讨会的摘要也可以在“材料研究学会通报”和“美国显微镜学会通报”中找到。"

9981689SinclairThis award supports the participation of American scientists in a U.S.-Japan seminar on Contribution of In Situ Electron Microscopy to Understanding and Creation of Advanced Materials, to be held in Kyoto, Japan, from November 7-10, 2000. The co-organizers are Professors Robert Sinclair at Stanford University and Professor Hiroyasu Saka at Nagoya University in Japan. The majority of in situ TEM (transmission electron microscopy) is carried out in the U.S. and in Japan. The former has strengths in materials science applications (e.g. thin film deposition, semiconductor defect behavior, and catalysis), whereas the latter has a wider variety of hardware (e.g. higher voltage microscopes, higher temperature specimen holder, and piezo-electric devices). Currently there is very little basis for the exchange of ideas, experiments or personnel. This seminar will include presentations of the most recent developments in the field. In addition, the strengths of the two countries' approaches will be highlighted. A significant portion of time will then be allocated to developing the field in the future and assuming definitive collaborations.Many high technology materials these days are made from the atomic level up (e.g. microelectronic, computer hard disks, nanomaterials). Understanding and improving their performance requires examination at extremely high levels of magnification and resolution, which is provided by transmission electron microscopy. This method is being applied in an increasing number of ways and in a more innovative fashion. Seminar organizers have made a special effort to involve younger researchers as both participants and observers. The exchange of ideas and data with Japanese experts in this field will enable U.S. participants to advance their own work, and will set the stage for future collaborative projects. Dissemination plans for the seminar proceedings include publication in the "Journal of Electron Microscopy." A summary of the symposium should also be available in "Materials Research Society Bulletin," and "Microscopy Society of America Bulletin."