Acquisition of a Low-Energy Electron Microscope

hanonlow - energy Electron Microscopy （LEEM）用于生成横向分辨率优于10纳米的表面实时图像。表面可以在任意高温下和生长过程中成像。LEEM中的对比是由于表面的电子反射率不同而产生的，这反映了表面结构、化学和磁性质的变化。该奖项将帮助在卡内基梅隆大学建立一个LEEM设施，供跨越四个大学院系的跨学科研究小组使用。提议的研究项目包括研究表面的相变、二维粗化和生长、阶跃和相边界波动、GaN生长、有机薄膜的润湿、表面磁性、手性表面的生长以及薄膜生长中的织构发展。低能电子显微镜（LEEM）用于生成表面的实时图像，其横向分辨率优于10纳米，在生长过程中，以及在任意高温下。这些独特的特征使得研究表面生长的细节前所未有。将在卡内基梅隆大学建立一个LEEM设施，供一个跨学科研究小组使用。LEEM将应用于广泛的生长问题，从表面化学和物理的基础研究，到新磁性介质开发中的工艺优化。

0079416HanonLow-Energy Electron Microscopy (LEEM) is used to generate real-time images of surfaces with a lateral resolution of better than 10 nanometer. Surfaces can be imaged at arbitrarily high temperatures, and during growth. Contrast in LEEM arises because of differences in electron reflectivity at the surface, which reflect variations in the structural, chemical and magnetic properties of the surface. This award will help establish a LEEM facility at Carnegie Mellon University for use by an interdisciplinary group of researchers spanning four University departments. Proposed research projects include investigations of phase transitions at surfaces, two-dimensional coarsening and growth, step and phase boundary fluctuations, GaN growth, wetting of organic films, surface magnetism, growth at chiral surfaces, and texture development in thin film growth.Low-Energy Electron Microscopy (LEEM) is used to generate real-time images of surfaces with a lateral resolution of better than ten nanomters, during growth, and at arbitrarily high temperatures. These unique features allow growth at surfaces to be studied in unprecedented detail. A LEEM facility will be established at Carnegie Mellon University for use by an interdisciplinary group of researchers. LEEM will be applied to a wide range of growth problems, from fundamental investigations of the chemistry and physics of surfaces, to process optimization in the development of new magnetic media.