Development of a Technique to Maximize the Useful Yield in Secondary Ion Mass Spectrometry (SIMS) Analyses of Minerals and Glasses

该奖项支持旨在确定地质材料二次离子质谱仪(SIMS)研究最佳条件的研究。这一目标将通过以下方法实现：1)测量O2-、O-、K+和Cs+的初级离子束在~22.5到~5keV的入射能量下轰击硅酸盐玻璃的溅射产额(去除的原子/击中样品的初级离子)；以及2)测量不同初级物种和碰撞能量的硅酸盐玻璃中~60种微量元素的有用产额(检测到的离子/溅射的原子)，还将研究其他样品(分别注入铂族元素和氢离子的硫化物和玻璃)。这些基本数据将被重塑为一本通用的“最佳分析条件手册”，并将允许研究人员将SIMS应用于痕量元素和同位素比微量分析问题，以最低的样本消耗成本获得最高的灵敏度。***

0091796HervigThis award supports research with the goal of determining the optimum conditions for secondary ion mass spectrometry (SIMS) studies of geological materials. This goal will be accomplished by 1) measuring the sputter yield (atoms removed/primary ions striking the sample) of silicate glass bombarded by primary ion beams of O2-, O-, K+, and Cs+ at impact energies ranging from ~22.5 to ~5 keV and 2) measuring the useful yields (ions detected/atoms sputtered) of ~60 trace elements in silicate glass with the different primary species and impact energies, Additional samples (sulfides and glasses implanted with platinum group elements and hydrogen, respectively) will also be studied. These fundamental data will be recast into a general "handbook of optimum analysis conditions" and will allow researchers applying SIMS to problems in trace element and isotope ratio microanalysis to get the highest sensitivity at the lowest cost in terms of sample consumption. ***