50th Anniversary of Atomic Resolution Microscopy Conference

技术：这项资助支持一个科学家研讨会，他们不仅使用场离子显微镜和原子探针断层扫描，而且还使用STEM， HREM和AFM来讨论原子分辨率技术的发展。这个研讨会是针对年轻观众的，因为我们必须保存这一活动的思想史。对单个原子的观察是众多学科中大量当前和未来科学活动的基础。研讨会于2005年6月15日至17日在宾夕法尼亚州立大学举行，由宾夕法尼亚州立大学物理系与国际场发射学会（IFES）联合主办。研讨会将讨论的主题是：(1)FIM在原子分辨率方面的成就和最终发展的历史；(2)薄膜技术在表面科学中的应用；(3)原子探针FIM的起源及其在材料科学与工程中的早期应用；(4) APFIM及其应用的后续改进和现状；(5)原子和亚原子分辨率STEM、原子分辨率HREM、原子分辨率STM和原子力显微镜（AFM）；(6)原子分辨显微镜在表面和材料科学中的应用。非技术：这次会议是为了纪念在固体材料结构中观察单个原子的能力。历史上第一次，原子不再仅仅是一个理论结构，而是使用场离子显微镜（FIM）观察到的实验现实。原子分辨率开始于1955年10月11日，在宾夕法尼亚州立大学，Erwin W. Mueller教授的FIM实现了晶格原子分辨率。因此，2005年不仅是世界物理年，也是原子分辨率显微镜问世50周年。这比通过扫描透射电子显微镜（STEM）、高分辨率透射电子显微镜（HREM）、扫描隧道显微镜（STM）和原子力显微镜（AFM）观察原子要早很多年。所有这些显微镜都直接或间接地受益于Erwin Mueller在场电子显微镜（FEM）的早期研究，这是FIM的前身。研讨会汇集了来自世界各地使用这些显微镜的顶尖科学家。研讨会邀请了年轻的研究科学家，以进一步激发他们的热情，将广泛的原子分辨率技术应用于材料科学和工程中的许多不同问题。

TECHNICAL: This grant supports a workshop of scientists who are not only using field ion microscopy and atom-probe tomography, but also STEM, HREM, and AFM to discuss the development of atomic resolution techniques. This workshop is aimed at a young audience, as it is essential that we preserve the intellectual history of this activity. The observation of individual atoms is basic to a great deal of current and future scientific activity in a broad range of disciplines. The workshop takes place at the Pennsylvania State University on June 15th to 17th, 2005, hosted by the Pennsylvania State University Physics Department in association with the International Field Emission Society (IFES). Topics to be addressed at the workshop are: (1) A history of achievement and ultimate development of atomic resolution by FIM; (2) Applications of FIM to surface science; (3) Origin of atom probe FIM and early applications in materials science and engineering; (4) Later improvements and present state-of-the-art in APFIM and applications; (5) Atomic and sub-atomic resolution STEM, atomic resolution HREM, atomic resolution STM, and atomic force microscopy (AFM); and (6) Applications of atomic resolution microscopy in surface and materials science. NONTECHNICAL: The conference commemorates the ability to view individual atoms in the structure of a solid material. For the first time in history, atoms were no longer merely a theoretical construct, but an experimental reality observable using a field-ion microscope (FIM). Atomic resolution commenced on October 11th, 1955, at the Pennsylvania State University with the achievement of lattice atomic resolution by Professor Erwin W. Mueller's FIM. Thus the year 2005, in addition to being the World Year of Physics, will be the 50th anniversary of atomic resolution microscopy. This was many years before observations of atoms by scanning transmission electron microscopy (STEM), high-resolution transmission electron microscopy (HREM), scanning tunneling microscopy (STM), and atomic force microscopy (AFM) were achieved. All of these microscopies benefited directly or indirectly from Erwin Mueller's early research in field electron microscopy (FEM), the precursor to FIM. The workshop brings together leading scientists from around the world who are using these microscopies. The workshop includes young research scientists to further excite their enthusiasm for using a broad range of atomic resolution techniques for application to many different problems in materials science and engineering.