MRI: Acquisition of a Physical Property Measurement System for Research and Education

北佛罗里达大学将获得一个新的物理性质测量系统（PPMS）。PPMS能够在高达9特斯拉的电场中，在0.4至400k的温度范围内进行直流和交流电传输和热容量测量。研究项目包括：(1)探测基态电子水平，以提供抑制几种新型III-VI稀释磁性半导体（DMS）理论中可调参数所需的关键信息；(2)确定In1 xMnxSe中突出的热滞后是否涉及电荷密度波；(3)调查半导体（Zn1 xCrxTe）中室温铁磁性的报告。(4)帮助确定纳米结构GdAl2体系中的铁磁转变温度；(5)随着我们探索新型层状III-VI DMS，继续研究新材料。PPMS将影响当地的高中教师和北佛罗里达大学参与研究活动的本科生，以及通过高级本科生高级物理实验室的新高质量实验。这个主要的仪器也将影响到合作研究生院校的研究生和博士后。物理性质测量系统（PPMS）可以获得大量的数据来表征新材料，这些新材料正在研究中，有望在下一代固态器件中应用。由于发现了新材料的有用特性，技术上取得了重大进展。将几种实验技术、自动化和低成本结合到这个单一仪器（PPMS）中，形成了一个非常强大的研究工具，能够提供探索全新材料类别所需的高质量数据。北佛罗里达大学的新物理性质测量系统将对正在研究的半导体系统和纳米材料进行更全面的分析，并将研究范围扩大到目前无法进入的领域。PPMS将影响当地的高中教师和北佛罗里达大学参与研究活动的本科生，以及通过高级本科生高级物理实验室的新高质量实验。这个主要的仪器也将影响到合作研究生院校的研究生和博士后。目前正在研究的材料的潜在应用包括红外和夜视设备、光开关、存储芯片和高容量硬盘驱动器的新表面等。

Technical AbstractThe University of North Florida will acquire a new Physical Property Measurement System (PPMS). The PPMS is capable of making DC & AC electrical transport and heat capacity measurements over a 0.4 to 400 K temperature range in fields up to 9 Tesla. Research projects include (1) probing the ground state electronic levels to provide critical information needed to restrain adjustable parameters in the theory for several new III-VI Diluted Magnetic Semiconductors (DMS), (2) establishing if a charge density wave is involved in the prominent thermal hysteresis in In1 xMnxSe, (3) investigating reports of room-temperature ferromagnetism in a semiconductor (Zn1 xCrxTe), (4) helping identify ferromagnetic transition temperatures in nanostructured GdAl2 systems, and (5) continuing investigations of new materials as we explore the new class of layered III-VI DMS. The PPMS will affect local high school teachers and a host of undergraduate students at the University of North Florida involved in research activities as well as through new high-quality experiments in the senior-level undergraduate Advanced Physics Lab. This major instrumentation will also impact graduate and post-doctoral students at collaborating graduate universities. Lay AbstractThe Physical Property Measurement System (PPMS) can acquire the large amount of data needed to characterize new materials that are being investigated for potential application in the next generations of solid state devices. Significant advances in technology have been made by the discovery of useful properties of new materials. The combination of several experimental techniques, automation, and low cost into this single instrument (the PPMS) results in a very powerful research tool capable of providing the high-quality data needed to explore whole new classes of materials. The new Physical Property Measurement System at the University of North Florida will lead to a more comprehensive analysis of the semiconducting systems and nano-materials under study and expand the scope of research into currently inaccessible areas. The PPMS will affect local high school teachers and a host of undergraduate students at the University of North Florida involved in research activities as well as through new high-quality experiments in the senior-level undergraduate Advanced Physics Lab. This major instrumentation will also impact graduate and post-doctoral students at collaborating graduate universities. Potential applications for the materials currently being investigated include infra-red and night vision devices, optical switching, memory chips, and new surfaces for high capacity hard drives among others.