MRI-R2: Acquisition of an Aberration-Corrected Scanning Transmission Electron Microscope for Multidisciplinary Research and Education at UIC

0959470 klieu。技术摘要：该奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。透射电子显微镜（TEM）是研究功能纳米材料原子尺度结构-性能关系的重要工具。随着像差校正器的发展，在200kV下工作的tem的空间分辨率现已达到70pm。虽然大多数像差校正tem都经过优化以达到最高的空间分辨率，但它们的分析能力受到中等能量分辨率（200 kV时~0.8 eV）和无法进行原位实验的限制。该项目将获得下一代像差校正TEM，具有前所未有的空间和能量分辨率，用于UIC的多学科研究和教育。JEOL ARM 200CF集成了许多最新的创新技术，包括下一代球像差探针校正器（70 nm空间分辨率），高亮度冷场发射电子源（0.3 eV能量分辨率），可变加速能量（80-200 kV），以及改进的机械，热和磁屏蔽。该仪器的独特之处在于它能够在80-1000 K的温度范围内使用原位加热/冷却支架为成像和光谱提供超高分辨率。它为参与该项目的教师提供了研究广泛的跨学科问题的独特能力，包括复杂氧化物的相关行为，金属/氧化物界面的热稳定性，充满热量的碳纳米管，以及空气中纳米颗粒与人体细胞的相互作用。该仪器将由UIC的研究资源中心运营，该中心是高级TEM教学和培训的卓越中心。UIC的教师将进一步利用该工具与周边学术机构和工业实验室的团队建立强有力的协作互动，以最大限度地扩大UIC多样化学生群体的培训和研究机会。非技术总结：该奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。纳米材料对几乎所有技术设备的进步都是必不可少的。为了研究和改进纳米材料，我们必须在原子水平上研究它们。透射电子显微镜是研究这类纳米材料原子结构的基本手段之一。直到最近，每一个传统的TEM的空间分辨率都受到光学成像系统像差的固有限制。然而，像差校正器的发展，相当于一副老花眼镜，可以校正显微镜的一些像差（如散光），使我们能够将原子尺度图像的空间分辨率提高三倍以上。空间分辨率的这种显著提高将使我们能够研究以前超出仪器能力范围的原子，并看到材料结构的更多细节。此外，原子分辨率现在也可以在80 K到1000 K的温度范围内实现，这将允许直接检查纳米材料的动态过程。该项目将获得一个像差校正的TEM，并升级该仪器的电子源，提供更清洁（即单色）的电子束，以进一步提高其成像和分析能力。该仪器允许UIC教员研究范围广泛的材料，从将多余热量转化为清洁能源的新结构，到更有效的数据存储材料，以及焊接烟雾对人体肺细胞的影响。该仪器将被安置在UIC的一个集中设施中，不仅为UIC的研究人员提供访问权限，而且还为来自世界各地的科学家提供访问权限。该仪器的安装极大地提高了UIC相关教师的教学和推广能力，并在中西部中部地区建立了一个卓越的区域中心，为来自芝加哥地区四所大学，两个国家实验室和无数工业研究实验室的学生和科学家提供无与伦比的TEM仪器。

0959470KlieU. of Illinois at ChicagoTechnical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). Transmission electron microscopy (TEM) is an essential tool in the study of atomic-scale structure-property relationships of functional nano-materials. With the development of aberration correctors, the spatial resolution of TEMs operated at 200kV has now reached 70 pm. While most aberration-corrected TEMs are optimized to achieve the highest spatial resolution, their analytical capabilities are limited by a moderate energy-resolution (~0.8 eV at 200 kV) and the inability to perform in-situ experiments. This project will acquire a next-generation aberration-corrected TEM, with unprecedented spatial and energy resolution for multidisciplinary research and education at UIC. The JEOL ARM 200CF incorporates many recent innovations including a next-generation spherical-aberration probe-corrector (70 nm spatial resolution), a high-brightness cold-field emission electron source (0.3 eV energy-resolution), variable acceleration energy (between 80-200 kV), as well as improved mechanical, thermal and magnetic shielding. The instrument is unique in its abilities to provide ultra-high resolution for imaging and spectroscopy in the temperature range between 80-1000 K using in-situ heating/cooling holders. It provides the faculty involved in this project the unique abilities to study a broad range of interdisciplinary problems, including correlated behavior in complex oxides, thermal stability in metal/oxide interfaces, heat transfer filled carbon nanotubes, as well as the interaction of airborne nanoparticles with human cells. The instrument will be operated by UIC's Research Resources Center, a center of excellence for teaching and training of advanced TEM. The faculty at UIC will further use the instrument to develop strong collaborative interactions with groups at surrounding academic institutions and industrial laboratories to maximizing the outreach opportunities for training and research of UIC's diverse student body. Non-technical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). Nano-materials are essential to the advancement of virtually all technological devices. To study and improve upon nano-materials we must examine them on an atomic level. Transmission electron microscopy (TEM) is one of the fundamental means by which atomic structures of such nano-material can be studied. Until recently, the spatial resolution of every conventional TEM was inherently limited by the aberrations of the optical imaging system. However, the development of aberration correctors, the equivalent of a pair of reading glasses, which correct for some of the microscope's aberrations (e.g. astigmatism), has allowed us to improve the spatial resolution of atomic-scale images by more than a factor of three. Such significant improvements in spatial resolution will enable us to study atoms which have previously been beyond the range of our instrument capabilities, and to see far greater detail of a material's structure. In addition, atomic resolution can now also be achieved in the temperature range between 80 K and 1000 K, which will allow the direct examination of dynamic processes in nano-materials. This project will acquire an aberration-corrected TEM, and upgrade this instrument with an electron source, which provides a cleaner (i.e. monochromatic) electron beam to further improve its imaging and analytical capabilities. This instrument allows the UIC faculty to study a wide range of materials from new structures converting excess heat into clean energy, to materials for more efficient data storage, and the effects of welding fumes on human lung cells. The instrument will be housed in a centralized facility at UIC, and provides access not only to researchers at UIC, but also to scientists from all over the world. The installation of this instrument dramatically improves the teaching and outreach capabilities of the involved faculty at UIC, and establishes a regional center of excellence in a central Midwest location providing unparalleled TEM instrumentation access to students and scientist from four Universities, two National Laboratories and countless industrial research labs in the Chicagoland area alone.