Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems, July 8-9, 2010 Arlington, VA
Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems, July 8-9, 2010 Arlington, VA
批准号:
1040712
负责人:
Ralph Cavin
金额:
$4.96万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2010
资助国家:
美国
项目状态:
已结题
起止时间:
2010-06-01 至 2011-02-28
中文摘要
本次研讨会的目的是探讨和确定在耐故障电子混合信号电路和系统的设计领域的关键研究挑战。这一领域的利益,以确保持续和增加的可靠性,在健康相关的,运输,高性能计算和自我可持续的能源系统。 可靠性降低的一个原因是随着集成电路的特征尺寸减小,器件故障的概率增加。 然而,随着作为系统的一部分的模拟电路和组件的增加以及3-D集成密度的增加,出现了其他可靠性问题。 除了器件可靠性降低和参数不确定性增加的问题外,密集集成的元器件、电路、封装和子系统之间的复杂耦合往往过于复杂,无法在设计中充分考虑。 这种系统的故障不属于传统的通过/失败性质,可能是由设计错误(或不良设计)或操作条件引起的。 相反,对于混合信号组件以及应用级系统,更关心的是适度降级、从瞬态和永久错误中恢复以及系统级的鲁棒性。这表明,一个综合的方法,将所有层次的设计是必要的,以提供可靠性的系统用户。该研讨会将汇集混合信号电路和系统设计、仿真和测试相关领域的专家。研讨会将评估研究需求,以确保在医疗,运输和航空航天应用等安全关键领域的抗故障能力。
英文摘要
The objective of this workshop is to explore and identify the critical research challenges in the area of the design of failure-resistant electronic mixed-signal circuits and systems. This area is of interest to insure sustained and increased reliability in health-related, transportation, high performance computing, and self-sustainable energy systems. One cause of reduced reliability is the increasing probability of device failure as feature sizes of integrated circuits are reduced. However, with the increased presence of analog circuits and components as parts of systems as well as the increased 3-D integration density, other reliability concerns arise. Besides the problem of reduced device reliability and increased parameter uncertainty, the complicated coupling between densely integrated components, circuits, packaging and sub-systems is often too complex to be fully considered in the design. Failure of such systems is not of the traditional pass/fail nature and might be caused by either design errors (or poor designs) or operational conditions. Instead, for mixed-signal components as well as for systems at the application level, there is more concern with graceful degradation, recovery from transient and permanent errors, and robust behavior at the system level. This suggests that an integrated approach incorporating all levels of the design hierarchy is necessary to provide reliability to the system user. This workshop will bring together a select group of experts in the relevant fields of mixed-signal circuit and system design, simulation, and testing. The workshop will assess research needs for ensuring resistance to failure in safety-critical areas including medical, transportation, and aerospace applications.
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