MRI: Acquisition of Tip Enhanced Raman Spectroscopy System

来自纽约州立大学布法罗分校的Frank Bright教授及其同事Joseph Gardella、Athos Petrou、Esther Takeuchi和Sarbajit Banerjee将获得由化学公司共同资助的主要研究仪器(MRI)计划颁发的这一奖项，他们将获得尖端增强拉曼光谱(TERS)系统。该提案旨在加强各级的研究培训和教育，特别是在下列领域：(A)纳米晶体传感器平台，(B)二氧化钒和金属钒(MxV2O5，其中M=Na、K、铜、锌)纳米线，(C)可生物降解的修复和输送结构，(D)单个ZnMnTe量子点内的磁极化子，(E)先进的储能材料，(F)基于钻石的纳米分离，(G)防污和防污释放膜表面的纳米异质性，(H)羟基磷灰石成核和生长，(I)有机纳米管和周期性纳米材料，(J)衬底催化单层光刻和能量转换，(K)非晶态硒中的光结晶，(L)基于石墨烯异质结构的太赫兹技术的开发，以及(M)用于伤口传感和修复的灵活混合干凝胶/布拉格光栅平台。然而，正常拉曼光谱的强度不是很强，因此增强信号的方法是必不可少的。针尖增强拉曼光谱(TERS)方法是基于拉曼光谱、表面增强拉曼散射(SERS)和原子力显微镜(AFM)相结合的方法。TERS效应使用涂有金属涂层的AFM尖端作为天线，增强来自与尖端接触的样品区域的拉曼信号。由于原子力显微镜针尖是纳米尺度的，因此有可能在相同尺度上获得局部增强。通过区分尖端增强拉曼和正常拉曼(针尖远离样品)，可以从直径100 nm的区域获得拉曼信息。所要求的TERS系统将有助于薄膜、纳米结构和多孔表面的表征，并将用于培养本科生和研究生以及博士后。它还将用于K-12级的外联活动。

With this award from the Major Research Instrumentation (MRI) Program that is co-funded by Chemistry, Professor Frank Bright from SUNY Buffalo and colleagues Joseph Gardella, Athos Petrou, Esther Takeuchi and Sarbajit Banerjee will acquire a tip-enhanced Raman spectroscopy (TERS) system. The proposal is aimed at enhancing research training and education at all levels, especially in areas such as (a) nanocrystalline sensor platforms, (b) vanadium dioxide and metal vanadate (MxV2O5, where M = Na, K, Cu, Zn) nanowires, (c) biodegradable repair and delivery constructs, (d) magneto-polarons within single ZnMnTe quantum dots, (e) advanced energy storage materials, (f) nanodiamond-based separations, (g) nanoscopic heterogeneity within antifouling and fouling release film surfaces, (h) hydroxyapatite nucleation and growth, (i) organic nanotubes and periodic nanomaterials, (j) substrate-catalyzed monolayer photolithography and energy-conversion, (k) photo-crystallization within amorphous selenium, (l) development of terahertz technologies based on graphene heterostructures, and (m) flexible hybrid xerogel/Bragg grating platforms for wound sensing and restitution.Raman spectroscopy is a vibrational spectroscopy technique that serves as a powerful analytical tool to identify sample structures. However, the intensity of normal Raman spectroscopy is not very strong and thus ways to enhance the signal are essential. The tip-enhanced Raman spectroscopy (TERS) method is based on the combination of Raman spectroscopy, surface enhanced Raman scattering (SERS) and atomic force microscopy (AFM). The TERS effect uses a metal-coated AFM tip as an antenna that enhances the Raman signal coming from the sample area in contact with the tip. Because the AFM tip is on the nanometer scale, it is possible to obtain localized enhancement on the same scale. By differentiating the tip enhanced Raman from the normal Raman (tip away from the sample) it is possible to obtain Raman information from areas 100 nm in diameter. The requested TERS system will facilitate the characterization of thin films, nanostructures, and porous surfaces and will serve to train undergraduate and graduate students, as well as postdocs. It will also be used in outreach activities at the K-12 level.