Frontiers of Electron Microscopy in Materials Science 2011 (FEMMS 2011; Sonoma, CA; September 18 - 23, 2011

技术摘要：2011年第13届材料科学电子显微镜前沿会议（FEMMS）将于9月18日至23日在加州索诺玛举行。FEMMS是一个两年一次的会议，重点讨论电子显微镜（主要是TEM）在材料科学中的最新发展。鉴于最近像差校正器的发展革命以及对原位和超快TEM方法使用的兴趣日益增加，今年的会议是及时的。在今年的会议上，邀请了46位演讲者讨论的主题包括高分辨率成像和光谱学，超快和原位显微镜，3d成像技术以及纳米科学中的各种显微镜应用，包括材料界面/缺陷和生物工程中的有机材料。会议还邀请了一位杰出的讲师，阿奇·豪伊教授，他长期以来在电子显微镜领域做出了杰出的贡献。非技术总结：本次会议一般约有100名与会者。有关会议地点、组织和历史的详细信息可在会议网站上找到：http://femms2011.llnl.gov/。今年的会议论文集将发表在《超微显微镜》和《显微与微分析》（根据内容而定）上。会议记录的出版不仅为包括研究生在内的与会者提供了好处，也为其他不能参加会议的人提供了机会。本次会议的NSF资助将用于支付10名研究生的注册和住宿费用。NSF提案的一个主要目标是为未被充分代表的研究生（女性和少数民族）提供支持，以了解电子显微镜的最新能力，并与该领域的领导者建立联系和可能的合作。

TECHNICAL SUMMARY: The 13th conference on Frontiers of Electron Microscopy in Materials Science (FEMMS) 2011, will be held in Sonoma, CA, September 18 to 23. FEMMS is a biennial meeting focused on the most recent developments in the use of electron microscopy (primarily TEM) for materials science. This year's meeting is timely given the recent revolution in the development of aberration correctors and the increasing interest in the use of in-situ and ultrafast TEM methods. In this year's conference 46 speakers have been invited to discuss topics that include high resolution imaging and spectroscopy, ultrafast and in-situ microscopy, 3-D imaging techniques and various microscopy applications in nanoscience, including materials interfaces/defects and organic materials in bioengineering. The conference also features a distinguished lecturer, Professor Archie Howie, who has been selected for his long outstanding and exceptional contributions to the field of electron microscopy.NON-TECHNICAL SUMMARY: The conference is typically attended by about 100 participants. Details about the location, organization and history of the FEMMS conference can be found on the conference website: http://femms2011.llnl.gov/. The proceedings of this year's conference will be published in Ultramicroscopy and Microscopy and Microanalysis (depending on the content). Publication of the proceedings provides not only benefits to the conference attendees, including graduate students, but also provides opportunities for others who cannot participate in the conference. NSF support for this conference will be used to cover the registration and accommodation support for 10 graduate students. A main goal of the NSF proposal is to provide support for underrepresented graduate students (women and minorities) to learn about the latest capabilities in electron microscopy and to establish contacts and possible collaborations with leaders in the field.