RUI: Single Molecule Metrology in Scanning Probe Microscopy through Correction of Fast Time Scale Positional Errors

在这个由化学系化学测量和成像计划资助的奖项中，里士满大学的Matthew Trawick教授和他的本科生研究人员将得到支持，开发用于扫描显微镜伪影校正的新算法和软件。具体地说，Trawick教授和他的同事们将开发方法来校正由于静电充电和材料吸附到扫描尖端而产生的随时间变化的漂移，以及缓慢的平面内位置漂移。扫描显微镜工具和方法正在成为各种领域实验室的主要工具。像大多数其他显微镜方法一样，有一些仪器伪影会降低性能，特别是与最终的仪器分辨率有关。特拉威克教授和他的本科生正在开发新的软件工具，这些工具将广泛传播给研究社区，以帮助纠正一些最常见的成像伪影。在特拉维克教授的实验室接受培训的本科生将获得尖端实验和计算研究方面的实践经验，帮助他们成为技术劳动力中富有成效的成员。

In this award, funded by the Chemical Measurement and Imaging Program of the Division of Chemistry, Professor Matthew Trawick of the University of Richmond and his undergraduate student researchers will be supported to develop new algorithms and software for artefact correction in scanning microscopies. Specifically, Prof. Trawick and his colleagues will develop methods to correct for time-dependent drift due to electrostatic charging and adsorption of material to the scanning tip, as well as for slow, in-plane positional drift.Scanning microscopy tools and methods are becoming workhorse instruments in laboratories working in a variety of areas. Like most other microscopy methods, there are instrumental artefacts that degrade performance, especially related to ultimate instrumental resolution. Professor Trawick and his undergraduate research students are developing new software tools, which will be broadly disseminated to the research community to help correct for some of the most common imaging artefacts. The undergraduate students being trained in Professor Trawick's laboratory will obtain hands-on experience in cutting-edge experimental and computational research, helping them to become productive members of the technological workforce.