Microwave Impedance Microscopy Study of Topological Structures of Quantum Materials

* 技术摘要 * 该计划的目标是研究具有电对比度的量子材料的局部结构。 由于其科学和技术的重要性，复杂量子材料的电子性质一直是一个重要的研究领域。 作为模型材料系统，对它们的理解往往会带来远远超出这些材料本身的启示，以及重要的技术。 该领域的最新发展是这些材料中的局部组织的重要性，如边缘通道，畴壁，玻璃状图案和界面结构。因此，它是非常可取的，以探测外部激励的局部电响应，并获得洞察这些材料中的电子组织。 进行这项研究的实验工具是一种新型的扫描近场微波阻抗显微镜（sMIM）。通过优化的灵敏度，对电磁波的微小局部介电响应可以由RF电子器件检测以形成微波图像，空间分辨率由尖端直径确定，其可以比辐射波长小一百万倍。实验系统中高分辨率微波成像和温度/场环境的综合优势将使团队能够在空间上可视化许多有趣的物理过程。 该项目将支持博士生和博士后在这些高度复杂的实验中的教育，这些实验历来是从学术界到最先进技术行业的许多科学职业的优秀培训。* 非技术摘要 * 该计划的目标是研究继续Si革命的候选材料的电性能。 这种理解往往会带来远远超出这些材料本身的启示，以及重要的新技术。 这一领域的一个最新发展是地方组织在这些材料中的重要性日益显现。因此，非常需要探测对外部激励的局部电响应，并深入了解这些材料中的电子组织，从而优化调整其应用特性的机会。 进行这项研究的实验工具是一种新型的扫描近场微波阻抗显微镜（sMIM）。 该项目将支持博士生和博士后在这些高度复杂的实验中的教育，这些实验历来是从学术界到最先进技术行业的许多科学职业的优秀培训。 由于RF电子学的操作相对容易，因此对该技术及其对比机制的一阶理解很容易通过简单的集总元件电路模型来理解，这可以在高中物理课中教授。此外，科学和仪器开发的双重性质是一个很好的平台，从事大学生的研究。该技术也是工业上感兴趣的，例如在半导体计量中。

****Technical Abstract****The goal of this program is to study local structures of quantum materials with electrical contrast. Because of its scientific as well as technological importance, the electronic properties of complex quantum materials have been an important area of research. As model material systems, their understanding often leads to revelations well beyond these materials themselves, as well as to important technology. A recent development of the field is the emerging importance of local organizations in these materials, such as edge channels, domain walls, glassy patterns and interface structures. As a result, it is highly desirable to probe the local electrical response to external excitations and gain insight on electronic organization in these materials. The experimental tool to carry out this study is a novel scanning near-field microwave impedance microscopy (sMIM). With optimized sensitivity, the minute local dielectric response to electromagnetic waves can be detected by RF electronics to form microwave images, with a spatial resolution determined by the tip diameter which can be one million times smaller than radiation wavelength. The combined strength of high resolution microwave imaging and temperature/field environment in the experimental system will allow the team to spatially visualize many interesting physical processes. This project will support the education of a PhD student and postdoc in these highly sophisticated experiments, which have historically been excellent training for many scientific careers from academia to the most advanced technology industries. ****Non-Technical Abstract****The goal of this program is to study electrical properties of materials that are candidates to continue the Si revolution. This understanding often leads to revelations well beyond these materials themselves, as well as to important new technology. A recent development of the field is the emerging importance of local organizations in these materials. As a result, it is highly desirable to probe the local electrical response to external excitations and gain insight on electronic organization in these materials, thus optimizing the opportunity to tailor their properties for application. The experimental tool to carry out this study is a novel scanning near-field microwave impedance microscopy (sMIM). This project will support the education of a PhD student and postdoc in these highly sophisticated experiments, which have historically been excellent training for many scientific careers from academia to the most advanced technology industries. Because of the relative ease of operation of RF electronics, a first-order understanding of the technique and its contrast mechanism are easily understood with a simple lumped-element circuit models, which can be taught in high school physics classes. Further, the dual nature of both science and instrumentation development is an excellent platform to engage college students for research. This technology is also of industrial interest, for example in semiconductor metrology.