Beyond 3D - Tomographic Methodology, data analysis and application in material science as an integrated approach for dynamic and high throughput microscopy (Beyond 3D)

我们提出了一个互补的X射线显微镜概念，包括一个高分辨率和高速CT系统。为了实现中尺度和高通量的材料结构分析，我们提出了一个综合的方法，包括三个主要研究领域层析成像方法，材料科学数据分析与应用射线显微术作为高分辨率计算机层析成像的一个新兴领域，具有解决材料科学中许多问题的潜力。为此，不仅要对不同的材料采用最先进的仪器和方法，而且要在今后的项目中开发和测试新的方法。为了跟上变化的步伐，拟议的仪器应已被证明已经正常工作，但它也应该有选择，以整合新的实验方法。为了实现这些任务，一个互补的X射线显微镜的概念，包括一个高分辨率和高速CT，提出了设备的概念。通过使用现有的microCT系统（>200 kV，传输目标，焦斑尺寸< 1 µm）实现高吞吐量，该系统应由Fraunhofer IzfP为本项目提供，并升级为两个可更换的原位级（用于峰值力高达400 N的疲劳实验和高达15 kN的动态应力/应变应用）。为了对局部缺陷的形成和发展进行持续的和基本的了解，（低至60 nm体素尺寸）是选定样品的强制性要求，将通过基于直接放大显微镜的XRM-II显微镜实现，允许对应于60 nm（0.12 mm视场）和600 nm（1.2 mm视场）之间的体素尺寸的100 x到1000 x之间的可变放大率。从材料科学学科中的研究问题开始，执行高通量和/或高分辨率层析成像。因此，术语高通量在更广泛的意义上解释，并且可以指通过网格对材料参数空间的同时断层扫描，或动态过程的成像，或使用多尺度方法的分层成像。在断层扫描之后，总是需要数据处理步骤来将大量原始数据转换为统计相关的定量信息，这些信息可用于确认或丢弃原始假设。基于提取的信息，通过形成新模型，预测和优化材料参数，并最终形成新的假设，闭合材料科学的循环。

We propose a complementary X-Ray Microscopy concept, consisting of a high resolution and a high speed CT system.To realize a mesoscale and high throughput material structure analysis we propose an integrated approach including the three main research areas Tomography Methodology, Data Analysis and Applications in Materials Science X-ray microscopy as a new emerging field in high resolution computed tomography has the potential to solve numerous problems in materials science. For this purpose, not only state-of-the-art instruments and methods should be applied to different materials, but also new approaches should be developed and tested in further projects. To stay abreast of changes the proposed instrumentation should have proven to already work properly but it should also have the option to integrate new experimental approaches. For realization of these tasks, a complementary X-Ray Microscopy concept, consisting of a high resolution and a high speed CT, is proposed as apparatus concept. High throughput will be realized by using an already existing microCT-system (>200 kV, transmission target, focal spot size < 1 µm), which shall be provided by Fraunhofer IzfP for this project and upgraded with two exchangeable in-situ stages (for fatigue experiments up to 400 N peak force and for dynamic stress/strain applications up to 15 kN). For an ongoing and fundamental understanding of local defect formation and development a complementary high resolution analysis (down to 60 nm voxel size) is obligatory for selected samples and will be enabled by the XRM-II microscope, based on direct magnification microscopy, allowing variable magnifications between 100x to 1000x corresponding to a voxel size between 60 nm (0.12 mm field of view) and 600 nm (1.2 mm field of view). Starting from a research question in the material science discipline, high throughput and /or high resolution tomography is performed. Hereby, the term high-throughput is interpreted in a wider sense and can refer to either simultaneous tomography of a space of material parameters via a grid, or the imaging of dynamic processes, or hierarchical imaging using a multiscale approach. After tomography, a data processing step is always required to transfer the large amounts of raw data to statistical relevant, quantitative information that can be used to confirm or discard the original hypothesis. Based on the extracted information, the loop to material science is closed via the formation of new models, prediction and optimization of material parameters and ultimately, the formation of new hypothesis.