Near-field optical investigation of quantum emitters on the nanoscale (C02)

C2项目将应用非线性光学近场技术来研究发射单光子的六方氮化硼(HBN)中的点缺陷。该项目的目的是使用散射扫描近场光学显微镜(SSNOM)来评估光学发射体的响应以及使用诸如尖端增强拉曼光谱(TERS)、尖端增强相干反斯托克斯拉曼散射和尖端增强受激拉曼散射等非线性等离子体增强技术的晶体结构。因此，拉曼散射允许识别所讨论的特定hBN缺陷的特征和唯一指纹。

Project C2 will apply non-linear optical nearfield techniques to investigate point defects in hexagonal boron nitride (hBN), which emit single photons. The aim of the project is to employ scattering scanning near-field optical microscopy (sSNOM) to assess the optical emitter response as well as the crystal structure using non-linear plasmon-enhanced techniques such as tip-enhanced Raman spectroscopy (TERS), tip-enhanced coherent anti-Stokes Raman scattering, and tip-enhanced stimulated Raman scattering. Raman scattering thereby allows identifying characteristic and unique fingerprints of the specific hBN defects in question.