Transmission Electron Microscope (TEM)

拟议中的透射电子显微镜将是我们旧的120千伏LaB6 JEOL JEM 1210 STEM的替代仪器，该STEM于1994年由DFG资助。新仪器将结合改进的成像、选区电子衍射和能量色散X射线分析技术，用于处理束敏感材料，即粘土矿物、纳米颗粒、薄膜(例如等离子涂层、生化或金属处理的样品)。高分辨率成像、电子衍射和成分分析(使用能量色散X射线)在亚微米到纳米尺度的观察中的成功结合，是我们目前对细颗粒材料(粘土矿物和纳米颗粒)和薄膜/界面材料的研究活动的关键要求。瞬变电子显微镜将被安置在FIB-SEM房间附近的地学电子微束装置中，以最大限度地减少精密瞬变电子显微镜薄片的传输距离。这些设备将作为电子微束股的一部分进行管理，该股由经济地质、矿物学和地球化学工作组运营，将提供新仪器所需的技术支助人员、空间和样品制备工具。该显微镜将支持地球科学、物理和生物化学研究小组目前和正在进行的活动。

The proposed transmission electron microscope (TEM) will be a replacement instrument for our old 120 kV LaB6 JEOL JEM 1210 STEM that was financed by the DFG in 1994. The new instrument will combine improved techniques of imaging, selective area electron diffraction and energy dispersive X-ray analysis for working with beam sensitive materials, namely clay minerals, nanoparticles, thin films (e.g. plasma coated, biochemical or metallic treated specimens). The successful combination of high-resolution imaging, election diffraction and compositional analyses (using energy dispersive X-rays) at the submicron- to nanometer-scale of observation is a key requirement for our current research activities on fine particulate materials (clay minerals and nanoparticles) and thin filmed/interface materials. The TEM will be housed in the geosciences Electron Microbeam Unit adjacent to the FIB-SEM room to minimize the transport distance of the delicate TEM lamellae. The equipment will be managed as part of the Electron Microbeam Unit, which is run by the Economic geology, mineralogy and geochemistry working group will provide the technical support staff, space and sample preparation tools needed for the new instrument. The microscope will support current and ongoing activities of research groups from the geosciences, physics and biochemistry.