High resolution analytical transmission electron microscope

微纳米结构研究所（IMN）运行纳米分析和电子显微镜中心（CENEM）的电子显微镜设施，这是弗里德里希-亚历山大大学（FAU）埃尔兰根-纽伦堡的跨学科中心和用户设施。CENEM为FAU的研究人员提供了用于先进材料表征的高分辨率和纳米分析技术。在透射电子显微镜领域，CENEM配备了2014年安装的双校正单色TEM/STEM和25年前安装的带基本分析功能的常规TEM（EDXS）。对于后者，制造商不再保证服务，并于2017年终止了服务合同。该显微镜仍在运行，并在该设施中使用。但是，长期使用不再能保证。CENEM的另一个25岁的高分辨率TEM已经在2017年由于越来越多的硬件问题而被拆除。由于双校正单色TEM/STEM的高度复杂性，只能由IMN和CENEM训练有素的成员操作。因此，目前只有传统的TEM可用于CENEM用户自己的工作。为了取代两台旧的显微镜，并为我们的用户提供最先进的TEM方法，我们申请了一台现代化的高分辨率TEM/STEM，能够进行高效的分析工作（EDXS，EELS）以及电子断层扫描。CENEM的电子显微镜设备的用户来自FAU的各个研究所，并在材料科学，物理，化学，工艺工程和相关领域的材料相关问题上工作。IMN的成员还将使用新显微镜的先进功能进行各种合作研究项目的研究，包括SFB 953，SFB-TR 103，GRK 1896，SFB 1411（正在审查），以及两个关于液体界面催化和液相外延的拟议SFB。为了能够满足对高分辨率分析、3D表征和原位TEM不断增长的需求，所要求的TEM/STEM仪器配备了探针校正器、具有小能量扩散的高亮度电子源、快速相机、大面积EDX检测器（用于快速映射和高灵敏度）、最先进的EEL光谱仪和电子断层扫描功能。基于所要求的TEM与CENEM独特的原位样品架的兼容性，我们还计划在各种合作研究项目中使用新仪器进行先进的原位TEM工作。

The Institute of Micro and Nanostructure Research (IMN) runs the electron microscopy facility of the Center for Nanoanalysis and Electron Microscopy (CENEM), an interdisciplinary center and user facility of the Friedrich-Alexander Universität (FAU) Erlangen-Nürnberg. CENEM provides FAU’s researchers with high-resolution and nanoanalytical techniques for advanced materials characterization. In the area of transmission electron microscopy CENEM is equipped with a double-corrected monochromated TEM/STEM, installed in 2014, and a 25 years old conventional TEM with basic analytics (EDXS). For the latter the manufacturer does not guarantee service anymore and terminated the service contract in 2017. The microscope is still operative and used in the facility. However, a long-term usage cannot be guaranteed anymore. Another 25 years old high-resolution TEM of CENEM has already been dismantled in 2017 due to increasing hardware problems. Due to its high complexity of the double-corrected monochromated TEM/STEM can only be operated by highly trained members of IMN and CENEM. Therefore, only the conventional TEM is currently available for own work by CENEM’s users. In order to replace the two old microscopes and provide our users with state-of-the-art TEM methods, we apply for a modern high-resolution TEM/STEM with capabilities for efficient analytical work (EDXS, EELS) as well as electron tomography. The users of CENEM’s electron microscopy facility come from various institutes of FAU and work on materials related problems in materials science, physics, chemistry, process engineering and related areas. The advanced capabilities of the new microscope will also be used by the members of IMN for research in various collaborative research projects, including SFB 953, SFB-TR 103, GRK 1896, SFB 1411 (under review), and two proposed SFBs on catalysis at liquid interfaces and on liquid phase epitaxy. In order to be able to address the steadily increasing demand for high-resolution analytics, 3D characterization and in situ TEM, the requested TEM/STEM instrument is equipped with a probe-corrector, a high-brightness electron source with small energy spread, a fast camera, a large-area EDX detector (for fast mappings and high sensitivity), a state-of-the-art EEL spectrometer, and capabilities for electron tomography. Based on compatibility of the requested TEM with the unique set of in situ sample holders at CENEM we also plan to use the new instrument for advanced in situ TEM work in the various collaborative research projects.