Raman microscope for tip-enhanced Raman scattering (TERS)

为了在纳米尺度上进行光谱分析，我们需要一套尖端增强拉曼散射(TERS)装置。通过将扫描探针显微镜和拉曼光谱仪相结合，TERS可以记录空间分辨率为10-100 nm的光谱。我们计划使用这种方法来研究低维材料的物理性质，如二维半导体、石墨烯和碳纳米管。我们的目标是获得关于少层2D材料的物理性质及其潜在的缺陷、化学官能化、晶体取向和堆积顺序的潜在修饰的局域光谱信息。特别是，石墨烯或过渡金属双卤化物等原子薄2D材料的堆叠可能会由于晶格常数或层之间的扭曲角不匹配而导致莫尔超晶格。这种莫尔结构以大约10-20 nm的长度尺度调制光学和电学性质。TERS非常适合于研究莫尔诱导效应的光学和结构特性，以及2D材料和碳纳米管的其他局部修饰。因此，这种先进的方法为低维材料的物理性质提供了新的见解，超越了传统的光学光谱学。

In order to perform optical spectroscopy on the nanometer scale, we request a setup for tip-enhanced Raman scattering (TERS). By combination of a scanning-probe microscope with a Raman spectrometer, TERS allows to record optical spectra with a spatial resolution of 10-100 nm. We plan to use this method for investigating the physical properties of low-dimensional materials such as two-dimensional (2D) semiconductors, graphene, and carbon nanotubes. Our aim is to obtain local spectroscopic information about the physical properties and their potential modifications by defects, chemical functionalization, crystallographic orientation and stacking order in few-layer 2D materials. In particular, stacking of atomically thin 2D materials like graphene or transition-metal dichalcogenides can result in a moiré superlattice due to mismatch of lattice constants or twist angle between the layers. This moiré structure modulates the optical and electronic properties with a length scale of approximately 10-20 nm. TERS is ideally suited to investigate the optical and structural properties of moiré-induced effects as well as other local modifications of 2D materials and carbon nanotubes. This advanced method thus offers new insights into the physical properties of low-dimensional materials beyond conventional optical spectroscopy.