Control of Chemical Bonding and Surface Modification of Nitrogen-Implanted Glassy Carbon by Doping of Different Kinds of Elements
Control of Chemical Bonding and Surface Modification of Nitrogen-Implanted Glassy Carbon by Doping of Different Kinds of Elements
批准号:
12650708
负责人:
TAKAHIRO Katsumi
金额:
$2.3万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2001
中文摘要
1. 在这项工作中,我对氮注入形成的Si掺杂氮化碳层进行了表征,以研究Si掺杂对氮化碳层化学键的影响。发现氮化碳层的Si浓度为5 ~ 8 at。%是无定形的,主要是sp^2键的碳结构和少量的C≡N键。XPS光谱的化学位移检测表明,硅预注入气相色谱中氮化层存在局部C=N-Si(C_nN_<3-n>)排列。氮化碳层中C=N- si (C_nN_<3-n>)结构的形成增加了N原子可能的键位数量,并可能导致植入的N原子具有更高的饱和水平;氮化层氮浓度从26 at增加。%至35%。%的si -pre -着床。此外,氮化层中的Si原子在氮注入过程中起到了防止氧掺入的作用,但其机制尚不清楚。结果表明,氢掺杂(~ 30 at。%)是获得氮注入气相色谱光滑表面的有效方法。N注入释放了一部分掺杂的氢原子,但同时也发生了氢的掺入。因此,氮注入层中氢的浓度超过20at。在任何氮注入剂量下。XPS和拉曼分析表明,掺杂d的GC的N注入层的化学键与未掺杂的GC的化学键非常相似,但含有N原子的石墨层的尺寸不同。较小尺寸的石墨层可以放松抛光划痕时引入的应变,从而保持表面光滑。
英文摘要
1. In this work, I have characterized Si doped carbon nitride layer formed by N implantation to investigate effects of Si doping on the chemical bonding in the nitride layer. It is found that the carbon nitride layer with Si concentration of 5-8 at. % is amorphous and has predominantly an sp^2 bonded carbon structure with a small amount of C≡N bonds. The examination of chemical shifts in XPS spectra suggests the existence of local C=N-Si(C_nN_<3-n>) arrangements in the nitride layer in Si-preimplanted GC. The formation of the C=N-Si(C_nN_<3-n>) structures in the carbon nitride layer increases the number of possible bonding sites for N atoms and may result in the higher saturation level for the implanted N atoms ; the N concentration in the nitride layer increased from 26 at. % to 35 at. % by the Si-preimplantation. In addition, Si atoms in the nitride layer play a role in the prevention of oxygen incorporation during N implantation, although the mechanism is not yet known.2. It was demonstrated that the hydrogen doping (〜30 at. %) was an effective method to obtain a smooth surface of N-implanted GC. A part of the doped hydrogen atoms is released by N implantation, but hydrogen incorporation occurs simultaneously. Consequently, concentration of hydrogen in the N-implanted layer exceeds 20 at. % at any N implantation doses. XPS and Raman analysis reveals that chemical bonding in the N-implanted layer for the D-doped GC is quite similar to that for the undoped, GC, but the size of graphitic layers containing N atoms is different. The smaller size of the graphitic layers can relax the strain introduced at polishing scratches, which may maintain the surface smooth.
期刊论文(3)
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会议论文
K. Takahiro, N. Takeshima, K. Kawatsura, S. Nagata, S. Yamamoto, H. Naramoto: "Irradiation-induced improvement of crystalline quality of epitaxial Cu/Si(100) films"Surface and Coating Technology. (in press).
K. Takahiro、N. Takeshima、K. Kawatsura、S. Nagata、S. Yamamoto、H. Naramoto:“辐照诱导的外延 Cu/Si(100) 薄膜结晶质量的改善”表面和涂层技术。
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通讯作者:
K.Takahiro, N.Takeshima, K.Kawatsura, S.Nagata, S.Yamamoto, H.Naramoto: "Irradiation-induced improvement of crystalline quality of Epitaxial Cu/Si(100) films"Surface and Coating Technology. (発表予定).
K.Takahiro、N.Takeshima、K.Kawatsura、S.Nagata、S.Yamamoto、H.Naramoto:“辐照诱导的外延 Cu/Si(100) 薄膜结晶质量的改善”表面和涂层技术(待定)。呈现) )。
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作者:
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通讯作者:
K.Takahiro, N.Takeshima, K.Kawatsura, S.Nagata, S.Yamamoto, H.Naramoto: "Irradiation-induced improvement of crystalline quality of Epitaxial Cu/Si(100) films"Surface and Coating Technology. (印刷中).
K.Takahiro、N.Takeshima、K.Kawatsura、S.Nagata、S.Yamamoto、H.Naramoto:“辐照诱导的外延 Cu/Si(100) 薄膜结晶质量的改善”表面和涂层技术(正在出版)。 ))。
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通讯作者:
Well-ordered arranging of metal nanoparticles by low-energy ion beam irradiation and deposition
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批准号:22510113
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.75万
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财政年份:2010
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负责人:TAKAHIRO Katsumi
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依托单位:
Application of X-ray Photoelectron Spectroscopy to Characterization of Nano-and Subnano-particles Embedded in Dielectric Matrices
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批准号:19510116
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.83万
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财政年份:2007
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负责人:TAKAHIRO Katsumi
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依托单位:
海外基金