Studies on Normal-Operation-Aware Accurate Delay Fault Testing for VLSIs

由于我们的生活离不开计算机系统，因此计算机的可靠性至关重要。为了建立可靠的系统，作为系统的主要组成部分的超大规模集成电路(VLSI)需要进行测试，并且必须考虑到它们的工作环境来提高测试质量。在这一资助下，为了支持正常操作感知测试，开发了使用正常操作的测试模式和响应递送方法、热一致性感知内建自测试(BIST)方法、用于高质量伪随机BIST的线性反馈移位寄存器(LFSR)种子生成方法、以及用于生成具有期望特性的测试和诊断模式的约束测试生成框架。

Since our life is dependent on computer systems, reliability of the computers is essential. To create reliable systems, very large scale integration circuits (VLSIs), which are the main components of the systems, need to be tested and the test quality must be improved considering their operating environment. Under this grant, for supporting normal-operation-aware testing, a method of test pattern and response delivery using normal operation, a method of thermal-uniformity-aware built-in self-test (BIST), a method of linear feedback shift register (LFSR) seed generation for high quality pseudo-random BIST, and a framework of constrained test generation to generate test and diagnosis patterns with desired properties have been developed.