Development of Methods and Strategies for the Measurement, Interpretation and Analysis of Diffuse X-ray Scattering from Disordered Materials.

该应用程序旨在利用我们在无序材料的漫射散射测量和大规模计算机模拟分析方面的领先地位。许多工业上重要的材料，如陶瓷、超导体、催化剂、光电材料和矿物，其特殊性质都归功于其结构的无序性。这种混乱导致了漫射x射线散射，这可以用同步加速器x射线和强大的计算机来探测，以揭示材料纳米级结构的细节。正在开发的新方法将增强我们对材料结构和性能之间关系的详细理解，并有助于促进新材料的设计。

This application seeks to exploit our established lead in the measurement of diffuse scattering from disordered materials and its analysis using large-scale computer simulations. Many industrially important materials such as ceramics, superconductors, catalysts, electro-optical materials and minerals owe their special properties to the disorder in their structure. This disorder causes diffuse X-ray scattering which can be probed using synchrotron X-rays and powerful computers to reveal details about the material's nanoscale structure. The new methodology being developed will enhance our detailed understanding of the relationships between structure and properties in materials and help promote the design of new materials.