Nanoparticle Imaging with Polarization-interferometric Nonlinear Confocal Microscope

在这项工作中，将迈克尔逊型偏振矢量干涉仪到一个非线性共聚焦显微镜，我们提出了新的显微镜，以观察一个单一的纳米粒子不均匀掺杂的发色团。这里，在第一步中，我们设置偏振干涉共焦信号最小值，同时扫描纳米颗粒中不均匀区域之外的均匀基质。下一步，显微镜测量不均匀区域。结果，具有三阶磁化率的不均匀区域在具有高对比度的暗背景下发光。显微镜已经观察到单个纳米颗粒内部的检查图像。从共焦显微镜获得的三维图像由一系列沿z轴沿着的光学截面组成。显微镜可以分辨具有磁化率分布的纳米颗粒中的细节。

In this work, incorporating a Michelson-type polarization-vector interferometer into a nonlinear confocal microscope, we propose novel microscopy in order to observe a single nanoparticle inhomogeneously doped with chromophores. Here, in the first step, we set the polarization-interferometric confocal signal minimum while scanning homogeneous matrix outside of inhomogeneous areas in the nanoparticle. As a next step, the microscope measures the inhomogeneous areas. As a result, the inhomogeneous areas with third-order susceptibility shines out against the dark background with high contrast. The microscope has observed an inspection image inside the single nanoparticle. Three-dimensional image obtained from the confocal microscope proposed is comprised of a series of optical sections along the z axis. The microscope can resolve detail in the nanoparticle with susceptibility distribution.