Smart diagnostics for in situ light and particle beam imaging
Smart diagnostics for in situ light and particle beam imaging
批准号:
EP/H502351/1
负责人:
Roelof Van Silfhout
金额:
$8.47万
依托单位:
依托单位国家:
英国
项目类别:
Research Grant
财政年份:
2010
资助国家:
英国
项目状态:
已结题
起止时间:
2010 至 --
中文摘要
能够以极高的精度表征完全透明和原位的强光子、X射线和粒子光束,为基础科学和应用科学开辟了新的方向。无论是用于表征纳米尺寸的结构,允许在切割时在材料的不同深度进行动态激光光斑聚焦,还是在放射治疗期间控制X射线或粒子束的传输和剂量,这项新技术在提供可用于快速校正光束形状、位置和强度的实时测量和输出方面表现出色。在曼彻斯特大学,发明了一种高空间分辨率和高更新率的强流光束全透明成像的新方法。这一发展是由当前和未来设施的需求和终端用户的需求推动的,并与几个处于技术前沿的设施小组密切合作。这项技术一直在与选定的用户密切合作进行试验,并已被证明非常成功,以至于用户希望购买和使用这项创新技术。这种兴趣反过来又导致了对基础方法的保护,该方法得到了我们的技术转让办公室(UMIP Ltd.)的积极和财政支持。在对本发明的商业潜力进行深入评估之后。通过与潜在许可证持有者的会议,我们已经确定了希望在2010年将该技术商业化引入的首选商业合作伙伴。他们帮助我们制定了将我们的技术推向市场的战略。这一战略要求开发两种他们想要推向市场的产品。他们的兴趣是可以理解的:如果考虑到生产的技术演示的高质量,这得到了与合作用户收集的令人印象深刻的评估结果的支持。但最重要的是,这项技术提供了真正新的诊断能力。例如,测量光束横截面强度分布(成像)的能力是独一无二的,在其他任何地方都不具备。此外,实时图像处理系统通过大规模的并行处理,能够快速提取必要的数据(综合强度、中心位置和光束尺寸),消除了对高速接口和离线处理的要求。目前市场上其他任何地方都没有类似的系统。从直接与终端用户和潜在的许可证持有人交谈的市场研究表明,这项技术的销售将能够在现有和新客户中产生巨大的销售额。我们的目标是在8个月内创建这两个产品,并集成我们实时图像处理模块的修订版,准备一份展示我们设备性能和应用的白皮书,并发表文章告知潜在客户。这笔资金还将为我们提供资源,开始开发这项技术的进一步应用,使我们能够创建产品组合。这一提议的成功将在不损失专业知识的情况下支持参与原始工作的研究助理,使技术能够最有效地从研究和开发领域转移到商业领域。
英文摘要
The ability to characterise intense beams of photons, X-rays and particles fully transparent and in situ with supremely high precision opens up new directions in fundamental and applied sciences. Whether this is for the characterisation of nano-metre sized structures, to allow dynamic laser spot focusing at various depths of the material whilst cutting or to control the delivery and dose of a X-ray or particle beam during radiation therapy, the new technology excels in providing real-time measurements and outputs that can be used to apply fast corrections of beam shape, position and intensity. At the University of Manchester, a novel way to image intense beams fully transparent with high spatial resolution and a high update rate has been invented. The development has been driven by the needs of the current and future facility and end-user requirements in close collaboration with a couple of facility groups operating at the cutting edge of technology. The technology has been undergoing trials in close collaboration with selected users and has proven to be highly successful to the point that users want to buy and use this innovative technology. This interest, in turn, has led to a protection of the underlying method supported actively and financially by our technology transfer office (UMIP Ltd.) after an in depth evaluation of the commercial potential of the invention. Through meetings with potential license holders we have identified a preferred commercial partner that wants to introduce the technology commercially in 2010. They have helped us to define a strategy to go to market with our technology. This strategy calls for the development of two types of products that they want to introduce to the market. Their interest is understandable: if one considers the high quality of the produced technology demonstrators that is backed up by impressive evaluation results collected with collaborating users. But above all, the technology provides truly new diagnostics capabilities. For example, the ability to measure the cross-sectional intensity distribution (imaging) of the beam is unique and not available anywhere else. Also, the real-time image processing system that, through massive parallel processing, is able to extract essential data (integrated intensity, centre position and beam size) fast, removes the requirement of high-speed interfaces and off-line processing. A similar system is currently not available anywhere else on the market. Market research, from speaking directly to end users and potential licensees, shows that sales of the technology would be able to generate a significant volume of sales with both existing and new customers. It is our aim to create these two products within an 8-month period and to integrate a revised version of our real-time image processing module, to prepare a white paper which shows the performance and applications of our devices and to publish articles to inform potential customers. The funding would also give us resources to start developing further applications of the technology allowing us to create a product portfolio. Success of this proposal would support the research associate involved in the original work without loss of expertise, allowing the most efficient transfer of the technology from research and development to the commercial arena.
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High-resolution transparent x-ray beam location and imaging.
高分辨率透明 X 射线束定位和成像。
DOI:
10.1364/ol.36.000570
发表时间:
2011
期刊:
Optics letters
影响因子:
3.6
作者:
[Van Silfhout R]
通讯作者:
Van Silfhout R
On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors
使用像素化传感器进行无透镜原位 X 射线束诊断的分辨率和线性度
DOI:
10.1364/oe.21.004291
发表时间:
2013
期刊:
Optics Express
影响因子:
3.8
作者:
[Kachatkou A]
通讯作者:
Kachatkou A
Position and flux stabilization of X-ray beams produced by double-crystal monochromators for EXAFS scans at the titanium K-edge.
双晶单色仪产生的 X 射线束的位置和通量稳定性,用于钛 K 边缘处的 EXAFS 扫描。
DOI:
10.1107/s1600577513034747
发表时间:
2014
期刊:
Journal of synchrotron radiation
影响因子:
2.5
作者:
[Van Silfhout R]
通讯作者:
Van Silfhout R
DOI:
10.1107/s1600577513034759
发表时间:
2014-03
期刊:
Journal of synchrotron radiation
影响因子:
2.5
作者:
[Kachatkou A, Marchal J, van Silfhout R]
通讯作者:
van Silfhout R
A Power Efficient Heterogeneous Embedded Vision System
一种高能效的异构嵌入式视觉系统
DOI:
10.1007/s11265-023-01882-8
发表时间:
2023
期刊:
Journal of Signal Processing Systems
影响因子:
--
作者:
[Van Silfhout R]
通讯作者:
Van Silfhout R
共 6 条
Embedded vision systems - a platform for integrating modern imaging sensors and real-time image processing
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批准号:EP/I028536/1
-
项目类别:Research Grant
-
资助金额:$12.29万
-
财政年份:2011
-
负责人:Roelof Van Silfhout
-
依托单位:
Fast High-resolution 6D X-ray Micro-beam Characterisation
-
批准号:EP/E032605/2
-
项目类别:Research Grant
-
资助金额:$0.0万
-
财政年份:2008
-
负责人:Roelof Van Silfhout
-
依托单位:
Fast High-resolution 6D X-ray Micro-beam Characterisation
-
批准号:EP/E032605/1
-
项目类别:Research Grant
-
资助金额:$10.96万
-
财政年份:2007
-
负责人:Roelof Van Silfhout
-
依托单位:
Fast High-resolution 6D X-ray Micro-beam Characterisation
-
批准号:EP/E031994/1
-
项目类别:Research Grant
-
资助金额:$31.08万
-
财政年份:2007
-
负责人:Roelof Van Silfhout
-
依托单位:
海外基金