EPSRC Strategic Equipment - High Speed CT

x射线计算机断层扫描（XCT）是一种扫描技术，可以实现内部和外部几何形状的全3D可视化和询问。它在工业（特别是制造业）和学术研究中变得流行，因为它使我们能够看到比以往任何时候都多的各种长度尺度，并且完全无损。对于许多应用程序来说，获得如此丰富的数据所花费的时间令人望而却步，一次扫描需要数十分钟，甚至几个小时。该提案中概述的设备将在数十秒内实现高分辨率扫描，在一些基础研究中甚至更快。这是英国的第一次，将产生丰富的科学进步。已经有少量的基于实验室的XCT扫描仪的“动态”实验，其中样品（例如新材料）在每个加载步骤依次加载（例如压缩）和扫描。在这里，人们可以观察到材料随时间的变化，识别失效机制，突出潜在的制造改进，并有助于确定材料性能。研究如此之少的原因是，所需的扫描次数可能导致采集时间长达数天。该设备在速度上的显著提高将使连续获取数据集的总扫描时间减少到几分钟。然后，样品可以在离散的时间点进行评估，并集中在观察到的临界失效开始周围。凭借这种独特的表征能力，新型聚合物、陶瓷和金属合金的科学发展将大大加快。由于扫描所花费的时间，制造应用程序通常仅限于几个高价值的组件。显著的步进变化速度将允许高通量扫描，是理想的生产线内。这是一场重大革命的第一步，它将需要由机器学习算法驱动的大数据分析，在合理的时间尺度内提供接受/拒绝决策。总之，这将成为实现大批量、高分辨率和相关周期内100%检验的驱动因素。

X-ray Computed Tomography (XCT) is a scanning technique that enables full 3D visualisation and interrogation of internal and external geometries. It has become popular within industry (particularly manufacturing) and academic research as it enables us to see more than ever before at a variety of length scales and is completely non-destructive. The time taken to obtain this wealth of data is prohibitive to a number of applications with a single scan taking tens of minutes, up to a few hours. The equipment outlined in this proposal will enable high-resolution scans in tens of seconds, and even faster with some fundamental research. This is a UK first that will generate a wealth of scientific advancement.There have been a small countable number of "dynamic" experiments using lab based XCT scanners where a sample such as a novel material is sequentially loaded (e.g. compression) and scanned at each loading step. Here one can observe the changes in the material through time, identifying failure mechanisms, highlighting potential manufacturing improvements and aids in determining material properties. The reason for so few studies is that the number of scans required can lead to acquisition time of days. The substantial gain in speed with this equipment will reduce the total scan time to a matter of minutes with a continuously acquired dataset. The sample can then be evaluated at discrete points in time, and concentrate around the critical onset of failure observed. Scientific advancement in the development of new polymers, ceramics and metal alloys will be considerably accelerated with this unique characterisation capability.Manufacturing applications are often limited to a few high-value components because of the time taken to scan. The significant step change in speed will allow for high-throughput scanning that is desirable within the manufacturing line. This is the first step in a major revolution that will require big data analytics powered by machine learning algorithms to deliver accept/reject decisions in a reasonable time scale. Together this will be a driver for change in achieving 100% inspection of large component batches, at high resolution and at relevant cycle times.