High Resolution Ion Beam Analysis Facility

萨里离子束中心在使用MeV离子束分析技术方面有着悠久的历史（约40年），帮助英国学术界和工业界了解和开发从文化遗产和生物医学应用到电子和光子材料以及钢铁和陶瓷等多个领域的材料。在过去的几年里，新的探测器已经出现，它们大大提高了这些经典技术的分辨率（卢瑟福背散射、粒子诱导X射线发射和弹性反冲检测），这不仅增加了选择性，灵敏度和特异性的技术，但也有可能增加新的功能，将允许小的化学位移的X-射线信号，其可以在表面以下几微米的深度处和在完全环境条件下识别元件的键合状态。所使用的离子束强度很低，除了最敏感的材料外，所有材料都不会受到探测束的影响。所要求的新设施将大大提高英国目前的能力。

The Surrey Ion Beam Centre has a long history (~40 years) of employing MeV Ion Beam Analysis techniques to aid UK academia and industry in understanding and developing materials in a number of diverse areas from cultural heritage and biomedical applications to electronic and photonic materials and steels and ceramics. In the past few years new detectors have become available which substantially increase the resolution of these classic techniques (Rutherford Back Scattering, Particle Induced X-ray Emission and Elastic Recoil Detection) which not only increase the selectivity, sensitivity and specificity of the techniques but also have the potential to add new features that will allow the small chemical shifts in the X-ray signals which can identify the bonding states of elements at depths of a few microns below a surface and in full ambient conditions. The ion beams used are such low intensity that for all but the most sensitive of materials will remain unaffected by the probing beam.The new facilities requested will greatly enhance the current UK capability.