Microanalysis and Luminescence of III-V Semiconductors

该项目专注于技术上重要的半导体材料的表征，使用先进的技术来研究亚微米长度尺度下的材料组成、结构和光学特性。它与EPSRC战略设备奖密切相关，通过该奖项，一个新的价值100万英镑的场发射枪电子探针微型分析仪（fg - epma）正在TIC大楼安装。该机器将于2017年7月投入使用，将用于半导体的高空间分辨率x射线微分析和阴极发光研究。学生将与负责电子显微镜设备的高级研究员和主管一起工作，利用和扩展仪器的功能。获得的实验数据将通过该小组开发的软件工具进行组合，以提供尽可能多的关于材料和性能的信息，这些信息可以在后续设备中交付。其目的是产生关于一系列发光半导体样品特性的原始和重要结果，这将导致一系列高影响力的出版物和会议报告。一个关键的目标是在阿岭安异质结构中同时实现亚100nm长度尺度的WDX和CL映射。研究的样品和结构将通过与谢菲尔德、巴斯、剑桥、科克、柏林和诺丁汉等大学的外延专家以及工业界的合作提供。

The project focusses on characterisation of technologically important semiconductor materials, using advanced techniques that investigate material composition, structure and optical properties at a sub-micron length scale. It is closely connected to an EPSRC Strategic Equipment Award through which a new £1M field-emission gun electron probe micro-analyser (FEG-EPMA) is being installed in the TIC building. This machine, which will be ready for operation in July 2017, will be configured for highly spatially resolved x-ray microanalysis and cathodoluminescence studies of semiconductors. The student will work with the senior researcher in charge of the electron microscope facility, and the supervisors, to utilise and extend the capabilities of the instrument. The experimental data acquired will be combined via software tools developed in the group to provide as much information as possible on the material and on the performance that can be delivered in subsequent devices. The aim is to produce original and significant results concerning the properties of a range of light-emitting semiconductor samples which will lead to a series of high-impact publications and conference presentations. A key target is the demonstration of simultaneous WDX and CL mapping on a sub-100 nm lengthscale in AlInGaN heterostructures. The samples and structures to be studied will be provided through collaborations with epitaxy specialists at Universities including Sheffield, Bath, Cambridge, Cork, Berlin and Nottingham and from industry.