In-situ TEM Observations of Atomic Scale Dynamics at Materials Interfaces

该项目的目的是帮助进一步了解材料界面的原子尺度动力学。通过使用透射电子显微镜，可以直接在原位想象正常操作条件下的界面，从而可以对技术领先的材料进行准确分析。这种分析在材料科学的许多领域中生产更高效、更清洁和更有效的材料方面非常重要。 使用利物浦大学提供的像差校正透射电子显微镜，将开发一种使用各种技术（包括压缩传感和机器学习）的图像采集方法，以降低观察材料所需的光束能量，而不会损失图像质量。这种较低的光束能量将允许对目前无法成像的重要光束敏感材料进行精确成像，这将对国家和国际的研究和工业做出巨大贡献。

The aim of this project is to help further the understanding of atomic scale dynamics at materials interfaces. With the use of transmission electron microscopy, interfaces in their normal operating conditions can be directly imagined in-situ, allowing for accurate analysis of technology-leading materials. This analysis is important in the production of more efficient, cleaner, and effective materials in many areas of materials science. Using the aberration corrected transmission electron microscope available at the University of Liverpool, a method of image acquisition will be developed using a variety of techniques, including compressive sensing and machine learning, to lower the beam energy required to observe materials without a loss of image quality. This lower beam energy will allow accurate imaging of important beam sensitive materials that are currently incapable of being imaged that will have great contributions to both research and industry, nationally and internationally.