Quantum strategies for super-resolution microscopy

瑞利准则一直是光学仪器分辨率的主要标准，因为它禁止根据两个点光源的间隔和波长来区分它们。近年来，在超分辨率显微镜方面有了一些发展，并且有一些作品[3，4，5]表明，可以使用量子光学和量子计量学的方法来估计两个点源的分离，而不会遭受“瑞利诅咒”。这些工作研究了两个点源的情况，因此，该项目的目的是将这些结果扩展到多个点源，使用量子多参数估计理论的结果[1，2]。这些结果将使人们了解显微镜的分辨率是否真的可以提高，以及是否可以在瑞利极限以下进行量子成像。

The Rayleigh criterion has been the main criterion for the resolution of an optical instrument, as it forbids the distinction between two point light sources depending on their separation and their wavelength. In the recent years, there have been developments in super-resolution microscopy and there are works [3,4,5] which show that there can be an estimation as to the separation of two point sources, using methods from quantum optics and quantum metrology, that does not suffer from the "Rayleigh's curse". These works examine the case of two point sources, so, the aim of the project is to extend these results to multiple point sources, using the results from the quantum multi-parameter estimation theory[1,2]. The results will give an insight to whether the resolution of microscopes can actually be enhanced and whether there can be quantum imaging below the Rayleigh limit.