Novel scanning probe methods to manipulate and characterise molecular semiconductors for advanced applications

该项目的重点是使用先进的扫描探针显微镜（SPM）技术来解决分子电子学和自旋电子学的两个主要挑战。第一个挑战是需要控制衬底上半导体分子的取向，因为它们的性质是高度各向异性的。这可能是非常困难的，因为它依赖于平衡分子间和分子-基底相互作用，但我们最近发现表面偶极子可以诱导90度旋转。在这个项目中，铁电基板将被极化（在大面积和纳米级，见放置），使用压电力显微镜评估，并用于模板分子半导体的生长，其功能特性将使用开尔文探针力显微镜评估。第二个挑战是对基本性质的理解，如纳米尺度下分子材料中的电荷和激子输运。通过局部阳极氧化精确定义分子单晶中半导体域之间不同深度的绝缘势垒，并评估势垒周围的电荷、激子和自旋输运，将实现这一目标。同时解决这两个挑战将导致开发出高效的分子基器件。

This project focuses on the use of advanced scanning probe microscopy (SPM) techniques to address the two main challenges of molecular electronics and spintronics. The first challenge is the need to control the orientation of semiconductor molecules on substrates, since their properties are highly anisotropic. This can be notoriously difficult as it relies on balancing intermolecular and molecule-substrate interactions, but we have recently found that surface dipoles can induce 90- degree rotation. In this project, ferroelectric substrates will be poled (on large areas and at the nanoscale, see placement), assessed using piezo-force microscopy, and used to template the growth of molecular semiconductors, whose functional properties will be assessed using Kelvin probe force microscopy. The second challenge is the understanding of fundamental properties such as charge and exciton transport in molecular materials at the nanoscale. This will be achieved by precisely defining insulating barriers of varying depths between semiconducting domains in molecular single crystals via local anodic oxidation, and assessing charge, excitons and spin transport around the barriers.Addressing both challenges in parallel will result in high efficiency molecule-based devices being developed.