Making every electron count in atomic resolution microscopy

校正像差电子显微镜的发展，使单个原子成像具有前所未有的精度，获得了2011年沃尔夫物理学奖的认可。然而，目前从这种显微镜获得的丰富信息中只有非常有限的一部分被利用。通过收集以多种不同方式分散的电子的最大数据集，并使用电子-样品相互作用的基本理论，该项目将实现这些未开发数据的巨大潜力。这将提高扫描透射电子显微镜的效用远远超过其目前的水平。应用这些新技术将扩大我们对先进材料的结构和功能的理解。

The development of aberration-corrected electron microscopy, which allows individual atom imaging with unprecedented precision, was recognised by the 2011 Wolf Prize in Physics. However, only a very limited amount of the wealth of information obtainable from such microscopes is currently exploited. By collecting a maximal data set of electrons scattered in manifold different ways and using the fundamental theory of electron-specimen interaction, this project will realise the huge potential of this untapped data. This will improve the utility of scanning transmission electron microscopy far beyond its current level. Applying these new techniques will expand our understanding of the structure and function of advanced materials.