Defect characterisation in III-nitrides materials and devices using multimodal micro-spectroscopy

应用基于扫描电子显微镜的电子衍射技术，结合光致发光、电致发光和共聚焦拉曼成像，研究其结构、光学和电学性质。此外，该项目将使用多模式策略对从深紫外光到红外波长的光发射器和探测器进行可靠性和故障分析，以便将缺陷与设备的功能特性相关联。

Applying scanning electron microscopy-based electron diffraction techniques combined with photoluminescence, electroluminescence and confocal raman imaging to study structural, optical and electrical properties. In addition, this project will perform reliability and failure analysis of light emitters and detectors from deep ultraviolet to infrared wavelengths using multimodal strategies for correlation between defects and functional properties of devices.