A dual-layer flat panel x-ray detector based on an engineered amorphous chalcogenide alloy for quantifying coronary artery calcium

摘要 心血管疾病（CVD）是全球死亡的主要原因。根据美国心脏 协会，为早期治疗心血管疾病，并验证患者是否应该处方他汀类药物治疗，钙 应通过心脏计算机断层扫描（CT）进行评分。然而，有一个有限的应用， 由于CT空间分辨率有限（~1 mm）、剂量问题和自付费用， 病人为了应对CT钙评分的挑战，一种基于双层平板的新技术 探测器正在我们的R 01下开发“一个双层平板X射线探测器的基础上工程 用于定量冠状动脉钙的无定形硫属化物合金”以提供机会性钙评分 只要X光一出来该技术旨在为X射线成像提供一种机会性方法， 检测器，可改善冠状动脉钙（CAC）的检测和定量。它是基于一项专利 待处理的硒合金具有良好的光学和电学特性，可提高图像质量。每当X- 由于任何原因进行X射线检查，自动生成钙评分，不会给医疗保健带来额外的成本负担 系统将拟议的技术从功能原型提升到所需的就绪水平， 在向原始设备制造商（OEM）发放许可证时，存在与一致性和变化相关的领域 检测器和产量，应进行评价和评估。 在本增刊中，我们将把我们从概念到临床的学习：商业化创新（C3 i）计划 解决未包括在主奖项中但在颁发之前需要解决的关键领域 OEM合作伙伴我们将开发多个原型，以评估坏像素和整体探测器的分布 良率，以及识别这些缺陷分布的任何模式或趋势。康贝特人将以 将所提出的技术集成到OEM薄膜晶体管中所需的变化或挑战 背板利用这一补充奖的结果将大大加强初步数据 需要解决与拟议技术的制造过程相关的重要技术风险， 介绍给OEM合作伙伴。

ABSTRACT Cardiovascular disease (CVDs) are the leading cause of death globally. According to the American Heart Association, for early treatment of CVD and to verify if a patient should be prescribed statin therapy, calcium scoring via cardiac Computed Tomography (CT) should be performed. However, there is a limited application of calcium scoring due to limited spatial resolution of CT (~1 mm), dose concern, and out of pocket expense for patient. To address the challenges with CT calcium scoring, a new technology based on dual-layer flat panel detector is being developed under our R01 “A dual-layer flat panel X-ray detector based on an engineered amorphous chalcogenide alloy for quantifying coronary artery calcium” to provide opportunistic calcium score whenever X-ray is done. This technology aims to provide an opportunistic approach to X-ray imaging with a detector that improves detection and quantification of coronary artery calcium (CAC). It is based on a patent pending selenium alloy with favorable optical and electrical properties that enhance image quality. Whenever X- ray is done for any reason calcium score automatically is generated with no additional cost burden to healthcare system. To advance the proposed technology from a functioning prototype to readiness level required for licensing to the Original Equipment Manufacturer (OEM), there are areas related to uniformity and variation across detector and yield that should be evaluated and assessed. In this supplement, we will apply our learning from concept to clinic: commercializing innovation (C3i) program to address key areas that are not included in the parent award but needs to be address before being presented to OEM partner. We will develop multiple prototypes to assess the distribution of bad pixels and overall detector yield, as well as identifying any patterns or trends in the distribution of these defects. We will determine the required changes or challenges in integration of the proposed technology to the OEM thin-film transistor backplanes. Leveraging the outcome of this supplement award will significantly strengthen the preliminary data required to address important technical risk related to manufacturing process of the proposed technology to present to OEM partners.