analytical electron microscope (asem) for research and training in textural and chemical analysis

合成和天然样品的详细化学和结构分析是先进工程材料发展的核心，也是我们对地球和类地行星的理解的核心。电子显微镜是用来提供这种信息的现代仪器之一。1982年，多伦多大学地质系购买了一台带有固态x射线探测器的JEOL JSM-840电子显微镜，该系统能够提供具有高空间分辨率的成分信息。从那时起，该工具一直提供高质量的数据，以支持各种研究，从而产生了大量的出版物和论文。JSM-840现在已经运行了27年，迫切需要更换。这种仪器的不可避免的消亡将要求用户从更昂贵和更难以常规访问的设施获取相同的数据。这将大大降低研究的进展，以及我们培养学生掌握重要分析技术的能力。正在申请资金购买新的扫描电镜，最近升级的成像和x射线分析硬件可以接口。因此，新仪器将结合最先进的成像技术和用户友好的数据采集界面，促进研究生产力并提供高质量的培训经验。

Detailed chemical and textural analysis of synthetic and natural samples is central to the development of advanced engineered materials as well as to our understanding of the Earth and terrestrial planets. The electron microscope is one of a family of modern instruments used to provide this information. In 1982, the Department of Geology at the University of Toronto purchased a JEOL JSM-840 electron microscope with a solid-state x-ray detector, which is a system capable of providing compositional information with a high degree of spatial resolution. Since then, that instrument has consistently produced high quality data in support of diverse research that has resulted in a large number of publications and theses. The JSM-840 is now in its twenty-seventh year of operation and is in urgent need of replacement. The inevitable demise of this instrument will require users to obtain the same data from facilities which are both more expensive and more difficult to access routinely. This will significantly degrade the progress of research, and our ability to train students in an important analytical technique. Funds are being requested to purchase a new SEM, to which recently upgraded imaging and x-ray analysis hardware can be interfaced. Thus enhanced, the new instrument will combine state-of-the-art imaging with a user-friendly data acquistion interface, facilitating research productivity and providing a high quality training experience.