STEM-in-SEM: A Tool For the High Throughput Analytical Characterization of Materials at the Nanoscale

该提案寻求资金用于扫描透射电子显微镜检测器和辅助设备。 该设备将与我们现有的高分辨率场发射枪扫描电子显微镜在多学科的AMPEL电子显微镜用户设施。 这种STEM-in-SEM探测器，沿着相关的机械噪音消除系统，将对UBC研究人员在纳米尺度上研究材料的能力产生重大影响。 由于UBC目前没有分析型透射电子显微镜，拟议的STEM-in-SEM检测器将为UBC的研究人员提供唯一的能力，以观察和对无机材料进行纳米级化学分析。 这将大大加速电子用碳纳米结构以及结构合金中纳米级沉淀控制的新发展。 它还将为不列颠哥伦比亚大学的研究人员提供一种工具，可以在麦克马斯特大学加拿大电子显微镜中心等专业设施中以更高的吞吐量和更低的成本进行更高分辨率的实验。

This proposal seeks funds for a scanning transmission electron microscopy (STEM) detector and ancillary equipment. This equipment will be used in conjunction with our existing high resolution field emission gun scanning electron microscope in the multidisciplinary AMPEL Electron Microscopy User Facility. This STEM-in-SEM detector, along with the associated mechanical noise cancellation system, will have a major impact on the ability of UBC researchers to study materials at the nanometric scale. As UBC is currently without an analytical transmission electron microscope, the proposed STEM-in-SEM detector will provide the only capacity at UBC for researchers to both observe and perform nanoscale chemical analysis on inorganic materials. This will greatly accelerate new developments in both carbon nanostructures for electronics as well as nanoscale precipitation control in structural alloys. It will also provide researchers at UBC a tool that can bridge, at higher throughput and lower cost, higher resolution experiments at specialized facilities such as the Canadian Centre for Electron Microscopy at McMaster University.