Development of new technologies for the characterization of materials at high spatial resolution in field emission scanning electron microscopy

扫描电子显微镜(SEM)制造商继续推动扫描电子显微镜的性能，改进电子探测器，并开发新型附件。为了开启显微镜的新纪元，缺少的是应用和开发新分析技术的例子，这些技术使用了日立加拿大等扫描电子显微镜制造商的这一新开发。这份CRD研究计划提出了具体的应用，通过结合申请者的专业知识和日立加拿大公司新的扫描电子显微镜能力和技术来改进和开发分析技术。这一建议旨在解决四个问题：开发新的纳米材料的一个问题是准确地了解每个小特征的组成；使用纳米处理剂或纳米填充材料(如碳纳米管)对生物和软材料进行高分辨率成像和成分分析；通过使用任何现有的电子和X射线探测器来评估材料的微观结构来观察材料的真实表面的表面污染和损伤；在实验过程中了解纳米材料的机械性能，即原位观察和表征。

Scanning electron microscope (SEM) manufacturer continue to push the capability of the SEM, improve the electron detectors and develop novel attachments. What is missing to start a new era in microscopy are examples of application and development of new analysis techniques that use this new development from SEM manufacturer like Hitachi Canada. This CRD research proposal proposes specific applications, to improve and develop analysis techniques by combining the applicant expertise and Hitachi Canada new SEM capabilities and know-how. This proposal aim to address four problems: one problem of developing new nanoscale materials is to know accurately the composition of each small feature; high resolution imaging and composition analysis of biological and soft materials with nanoscale treating agents or nano-fillers like CNT; surface contamination and damage to observe the true surface of materials by using any of the available electron and x-ray detectors to assess their microstructure; understanding of the mechanical properties of nano-materials during the experiment, i.e., in-situ observation and characterization.