Infrared Imaging Methods for the Thermal Characterization of Materials

对当今广泛使用的材料的基本热性能进行可靠测量的需求不断减少。材料在各种条件下的导热系数、比热等的大小需要提供给计算机模型，这些模型已成为现代设计过程的基石。新材料需要进行原始性质测定，对许多长期使用的材料进行新的性质测定是可取的。对于电导率来说尤其如此，在特定的生产过程中，电导率会随着材料的特定成分和微观结构而发生很大的变化。

There is an undiminishing demand for reliable measurements of the basic thermal properties of the vast range of materials in use today. The magnitudes of thermal conductivity, specific heat etc. of materials subjected to all manner of conditions are required to feed the computer models that have become the bed-rock of the modern design process. Original property determinations are required for new materials and new determinations of the properties of many of the long used materials are known to be advisable. This is particularly true for conductivity which can vary considerably with the particular composition and microstructure produced in a material during a specific production process.